CMBIW-X Allicdata Electronics
Allicdata Part #:

298-12597-ND

Manufacturer Part#:

CMBIW-X

Price: $ 0.30
Product Category:

Connectors, Interconnects

Manufacturer: Panduit Corp
Short Description: MINI-COM 1-PORT BLANK MODULE, R
More Detail: Connector Blank Insert, Module White, Off
DataSheet: CMBIW-X datasheetCMBIW-X Datasheet/PDF
Quantity: 2000
1 +: $ 0.27720
10 +: $ 0.26838
25 +: $ 0.26334
50 +: $ 0.25616
100 +: $ 0.25137
500 +: $ 0.24658
1000 +: $ 0.24179
Stock 2000Can Ship Immediately
$ 0.3
Specifications
Series: Mini-Com®
Part Status: Active
RoHS Status: RoHS Compliant
Type: Blank Insert, Module
Color: White, Off
Size / Dimension: 18.30mm H x 15.40mm W
Material: Acrylonitrile Butadiene Styrene (ABS)
For Use With/Related Products: Mini-Com® Series (Flat, Sloped, Sloped Recessed or Blank)
Description

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

CMBIW-X, or Continuous Mode Birefringence Interferometric Waveguide Index Profiler X, is a cutting-edge technology used in the field of accessories for measuring the index of refraction of optical materials. The technology provides a high-precision measurement of optical materials and is used in a variety of applications such as measuring the accuracy of laser dispersive elements and refractive elements. This article will explain the application field of CMBIW-X and the working principle behind it.

CMBIW-X is widely used in the field of optical accessories for measuring the index of refraction of optical materials. The technology is able to measure the refraction index of a wide range of materials, including fused silica, sapphire, tungsten, and aluminum. It is also capable of measuring different types of optical layers and surfaces, such as coated mirrors, optical fibers, and waveguides. This technology is particularly useful in the production of precision optical devices, such as laser optics and fiber-optic cables.

The working principle of CMBIW-X is based on the birefringence interferometry. This technique uses light in different polarizations and measures the refractive indexes of different materials. The interference pattern that is produced by the light is then used to measure the birefringence of the optical materials. The accuracy of the measurements is typically in the range of 0.0001-0.001%.

In addition to measuring optical refraction indexes, CMBIW-X can also be applied to other types of optical measurements, such as the measurement of waveguides and other types of optical fibers. CMBIW-X can also be used to measure optical properties such as surface quality, temperature, polarization, and transmittance. The measurement accuracy is typically in the range of 0.0001-0.001%.

In conclusion, CMBIW-X is a versatile and powerful technology used in the field of optical accessories for measuring the index of refraction of optical materials. This technology provides a high-precision and accurate measurement of optical materials and is used in a variety of applications, such as the production of precision optical devices. The working principle of CMBIW-X is based on the birefringence interferometry, and it can also be applied to other types of optical measurements.

The specific data is subject to PDF, and the above content is for reference

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