LC4256C-3FT256AC Allicdata Electronics
Allicdata Part #:

LC4256C-3FT256AC-ND

Manufacturer Part#:

LC4256C-3FT256AC

Price: $ 0.00
Product Category:

Integrated Circuits (ICs)

Manufacturer: Lattice Semiconductor Corporation
Short Description: IC CPLD 256MC 3NS 256FTBGA
More Detail: N/A
DataSheet: LC4256C-3FT256AC datasheetLC4256C-3FT256AC Datasheet/PDF
Quantity: 1000
1 +: 0.00000
Stock 1000Can Ship Immediately
$ 0
Specifications
Series: ispMACH® 4000C
Packaging: Tray 
Part Status: Obsolete
Programmable Type: In System Programmable
Delay Time tpd(1) Max: 3.0ns
Voltage Supply - Internal: 1.65 V ~ 1.95 V
Number of Logic Elements/Blocks: 16
Number of Macrocells: 256
Number of I/O: 128
Operating Temperature: 0°C ~ 90°C (TJ)
Mounting Type: Surface Mount
Package / Case: 256-LBGA
Supplier Device Package: 256-FTBGA (17x17)
Base Part Number: LC4256
Description

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Embedded - CPLDs (Complex Programmable Logic Devices) can provide a wide range of support and capabilities for product engineers and hobbyists alike. One such device is the LC4256C-3FT256AC. It can deliver higher levels of integration and performance, and it can be used to solve many different logic functions and tasks. In this article, we will look at the application field and working principle of the LC4256C-3FT256AC.

The LC4256C-3FT256AC is a field-programmable device designed for use in embedded applications. It is a Complex Programmable Logic Device (CPLD) that combines 8k gates and 64 macrocells in a single chip, making it suitable for applications involving high-speed, high-performance, and low-cost logic solutions. The programmable logic can be used to perform logic operations such as logic combining, arithmetic operations, data storage and logic functions. The device also has built-in logic functions such as Schmitt triggers, flip-flops, and XOR gates.

The LC4256C-3FT256AC provides a wide range of application fields which include providing programmable logic for embedded MCUs or ASICs; creating multi-clock designs; and providing high-speed communication interface/data processing. These are just a few examples, but the actual application field of the device can be varied depending on the user\'s needs. The device can be used in circuit designs where complex logic designs are required, such as in digital signal processing, embedded systems, and mixed-signal designs. The device also provides a variety of features such as clock synthesizers, analog comparators, programmable I/O ports and configuration memory.

The LC4256C-3FT256AC has two working modes, the byte-wide I/O mode, and the word-wide I/O mode. In the byte-wide I/O mode, a single byte is transferred simultaneously to/from the device. This mode allows for easier coding of the device and is suitable for applications where speed is not critical. In the word-wide I/O mode, multiple bytes are transferred at once to/from the device. This mode allows for faster operation, but requires more code for the setup operation. The device also has an internal oscillator and programmable delay-line that can be used to synchronize signals.

The device also has a unique memory structure that allows it to store data and program code. It has two central address latches (CALs), one for program code and another for data. Both CALs can hold up to 64 bytes of data and are used to store the contents of the device\'s program memory. The CALs are also used to store configuration data, which is used to set up the device\'s working parameters when it is powered up. In addition, the device also contains two control logic units (CLUs), which are used to execute the instructions stored in the program memory.

Another interesting feature of the LC4256C-3FT256AC is the built-in test capability. This allows it to be used in a variety of test applications, such as device testing, system testing, environmental testing, functional testing, and fault diagnostics. The device can be programmed with a variety of test pattern generators, including a Logic Control RAM (LCRAM), a Complex Pattern-Matching RAM (CP-MRAM), or a Test Pattern Control RAM (TP-CRAM). The test data used in these tests can be loaded onto the device in the program memory or from an external source.

Overall, the LC4256C-3FT256AC is a powerful device that offers a wide range of features and capabilities. Its combination of 8k gates, 64 macrocells, and built-in test capability make it ideal for applications involving embedded systems, high-speed communication/data processing, and circuit designs requiring complex logic functions. Its programmable logic and memory structure also make it suitable for applications where speed is not critical.

The specific data is subject to PDF, and the above content is for reference

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