Allicdata Part #: | 08-1518-10H-ND |
Manufacturer Part#: |
08-1518-10H |
Price: | $ 0.61 |
Product Category: | Connectors, Interconnects |
Manufacturer: | Aries Electronics |
Short Description: | CONN IC DIP SOCKET 8POS GOLD |
More Detail: | N/A |
DataSheet: | 08-1518-10H Datasheet/PDF |
Quantity: | 1000 |
129 +: | $ 0.55284 |
Series: | 518 |
Packaging: | Bulk |
Part Status: | Active |
Type: | DIP, 0.2" (5.08mm) Row Spacing |
Number of Positions or Pins (Grid): | 8 (2 x 4) |
Pitch - Mating: | 0.100" (2.54mm) |
Contact Finish - Mating: | Gold |
Contact Finish Thickness - Mating: | 10.0µin (0.25µm) |
Contact Material - Mating: | Beryllium Copper |
Mounting Type: | Through Hole |
Features: | Open Frame |
Termination: | Solder |
Pitch - Post: | 0.100" (2.54mm) |
Contact Finish - Post: | Tin |
Contact Finish Thickness - Post: | 200.0µin (5.08µm) |
Contact Material - Post: | Brass |
Housing Material: | Polyamide (PA46), Nylon 4/6, Glass Filled |
Operating Temperature: | -- |
Termination Post Length: | 0.125" (3.18mm) |
Material Flammability Rating: | UL94 V-0 |
Current Rating: | 3A |
Contact Resistance: | -- |
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Sockets for ICs, Transistors
08-1518-10H is an electronic test socket designed for the evaluation of electronic integrated circuits (ICs) and transistors. It is a two-position, spring-loaded, Rockwell-Hardened test socket that connects the integrated circuit to a printed-circuit card or test fixture.
Application Field
The 08-1518-10H socket is commonly used for testing such integrated circuits as memories, microprocessors, microcontrollers, digital signal processors, transistors, optocouplers, and many other multi-pin ICs. It is suitable for testing electronic circuits in computers, consumer electronics, electronic toys, telecommunication equipment, LED drivers, automotive, medical, and other industrial applications.
The 08-1518-10H is often used by military and aerospace engineers for reliability testing of integrated circuits. It allows engineers to measure the electrical performance of IC packages under various conditions. The socket’s design reduces transient voltage spikes, crosstalk, and common-mode noise.
Working Principle
The 08-1518-10H test socket works by providing electrical connection between the integrated circuit (IC) and an external testing board. The socket consists of two separate sets of contacts – a set of stationary contacts located near the periphery of the socket, and a set of spring-loaded contacts located in the center of the socket. When an IC device is inserted into the socket, the two sets of contacts press against the IC device\'s leads, establishing electrical connections.
The socket also features an adjustable load plunger, which helps ensure reliable electrical connections between the contacts and the integrated circuit leads. When the plunger is activated, it pushes against the IC package, providing an additional force that ensures secure contact between the IC package\'s leads and the socket contacts.
Another important feature of the socket is its two-piece, Rockwell-Hardened construction. This ensures that it is able to withstand the frequent insertion and removal of IC devices, and that its contacts remain in good condition during testing applications.
In summary, the 08-1518-10H test socket is a reliable and cost-effective solution for testing a wide variety of integrated circuits and transistors. It provides a secure electrical connection between the IC device and the testing board, while simultaneously reducing the risk of damage to the electronic components during testing.
The specific data is subject to PDF, and the above content is for reference
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