10-3513-11H

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Sockets for ICs, Transistors

The 10-3513-11H is a versatile socket for ICs, transistors, and other components of similar form factor. It is designed to provide an electrical interface between a test lead and components, enabling them to be used reliably and accurately for testing and troubleshooting. By having a socket, components can be easily replaced when needed and provide an easier connection than simply soldering direct.

This series of IC socket is equipped with a probing receptacle that allows a variety of components of different specifications to be used, eliminating potential obstruction due to fixed plug-in depth when changing components in a regularly used testing and measuring system.

Application Field: The 10-3513-11H IC socket is ideal for general test and measurement, prototyping and development, testing of electrical circuits, etc. It is also suitable for production testing of electronic products. This socket is designed for low-profile components such as surface mount devices and can be used in automated test systems.

Working Principle: This series of IC socket utilizes a spring-action contact designed by state-of-the-art wire technology that achieves improved performance. The contact parts of each terminal are made in tape form and then stamped into a probe receptacle. The contact pins are formed to provide secure contact when connected to electronic components.

The 10-3513-11H IC socket offers a durable, reliable and highly conductive electrical connection between the component and test lead. The effective operation of the contacts in a wet environment is determined by the contact pressure retainer and the base insert used in its design. This can help reduce dust contamination of components during testing or in automated production environments.

The 10-3513-11H socket features self-adjustment capability so that all contacts are forced to meet the peripheral surface of the component, irrespective of the size and shape of the component and the test lead. This helps ensure long-term reliable contact.

In order to reduce the occurrence of false alarm, the 10-3513-11H socket is designed with shock absorbers on its lower surface. This prevents shock or vibration from affecting the test lead-to-component connection and reduces the occurrence of false alarm.

The 10-3513-11H IC socket is available in a wide range of sizes and configurations to meet different needs and application requirements. The socket can be used with a variety of test leads, including Gijones, SEMS, bare tinned wires, and other similar products. The socket also has a robust outer shell that provides excellent protection and insulation against environmental elements.

The 10-3513-11H socket offers an easy, secure and reliable connection when used with corresponding ICs, transistors and other components. The socket is durable, shock-proof, and resistant to dust, water, and other environmental elements. This makes it ideal for use in production, research and development, and prototyping.

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