
Allicdata Part #: | 32-6553-18-ND |
Manufacturer Part#: |
32-6553-18 |
Price: | $ 49.10 |
Product Category: | Connectors, Interconnects |
Manufacturer: | Aries Electronics |
Short Description: | CONN IC DIP SOCKET ZIF 36POS TIN |
More Detail: | N/A |
DataSheet: | ![]() |
Quantity: | 1000 |
56 +: | $ 44.18670 |
Termination: | Solder |
Contact Resistance: | -- |
Current Rating: | 1A |
Material Flammability Rating: | UL94 V-0 |
Termination Post Length: | 0.110" (2.78mm) |
Operating Temperature: | -- |
Housing Material: | Polyphenylene Sulfide (PPS), Glass Filled |
Contact Material - Post: | Beryllium Copper |
Contact Finish Thickness - Post: | 200.0µin (5.08µm) |
Contact Finish - Post: | Tin |
Pitch - Post: | 0.100" (2.54mm) |
Series: | 55 |
Features: | Closed Frame |
Mounting Type: | Through Hole |
Contact Material - Mating: | Beryllium Copper |
Contact Finish Thickness - Mating: | 200.0µin (5.08µm) |
Contact Finish - Mating: | Tin |
Pitch - Mating: | 0.100" (2.54mm) |
Number of Positions or Pins (Grid): | 36 (2 x 18) |
Type: | DIP, ZIF (ZIP), 0.6" (15.24mm) Row Spacing |
Part Status: | Active |
Packaging: | Bulk |
Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us: sales@allicdata.com
Sockets for ICs, transistors, and other components are tools that allow electronic components to be tested, evaluated, and repaired. The 32-6553-18 socket is a special type of a socket commonly used for the testing, evaluation, and repair of semiconductor-based components. This article will discuss the application fields and workings of the 32-6553-18 socket.
The 32-6553-18 socket is a multipurpose socket designed for testing, evaluation, and repair of a variety of semiconductor-based components. It is designed to be used with a wide range of components, from small-scale transistors to high-power MOSFETS. The socket is capable of accommodating components with a wide range of sizes and features, including leadless, DIP, and surface mount packages. In addition, it allows for the easy removal of components from the board, which can be used for testing, evaluation, or replacement.
The 32-6553-18 socket utilizes a unique connection system for improved performance and durability. It uses a spring-loaded mechanism to ensure a strong connection between the socket and the component. This allows the socket to remain secure, even under high-power loads, while providing optimal contact force and conductivity. In addition, the socket features an enhanced insulation system that prevents damage to the component due to excessive heat.
The 32-6553-18 socket is typically used in applications that require testing and evaluation of components used in high-power applications. This includes automotive, electronics, industrial, and medical applications. In automotive applications, the socket is used to test and evaluate components that are used in automobiles, such as automotive sensors, actuators, and other components. In electronics applications, the socket is used to test and evaluate components that are used in consumer electronics, such as computers, audio/video systems, and household appliances. In industrial applications, the socket is used to test and evaluate components that are used in industrial machines, such as industrial motors, pumps, and other components. In medical applications, the socket is used to test and evaluate components that are used in medical devices, such as pacemakers, defibrillators, and other components.
The working principle of the 32-6553-18 socket is based on the concept of capacitive coupling. The socket generates a voltage that is applied to the component, and the electrical field created by the voltage is used to transfer electrons from the component to the socket. This results in a charge imbalance between the component and the socket, which is then regulated through current flow. This current flow is used to power the component and test its performance.
In conclusion, the 32-6553-18 socket is a specialized type of a socket designed for testing, evaluation, and repair of various semiconductor-based components. It utilizes a unique connection system for improved performance and durability and is typically used in applications that require performing testing and evaluation of components used in high-power applications. The working principle of the socket is based on the concept of capacitive coupling, which creates a charge imbalance between the component and the socket.
The specific data is subject to PDF, and the above content is for reference
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