| Allicdata Part #: | 36-6572-10-ND |
| Manufacturer Part#: |
36-6572-10 |
| Price: | $ 9.70 |
| Product Category: | Connectors, Interconnects |
| Manufacturer: | Aries Electronics |
| Short Description: | CONN IC DIP SOCKET ZIF 36POS TIN |
| More Detail: | N/A |
| DataSheet: |  36-6572-10 Datasheet/PDF |
| Quantity: | 1000 |
| 7 +: | $ 8.81461 |
| Termination: | Solder |
| Contact Resistance: | -- |
| Current Rating: | 1A |
| Material Flammability Rating: | UL94 V-0 |
| Termination Post Length: | 0.110" (2.78mm) |
| Operating Temperature: | -- |
| Housing Material: | Polyphenylene Sulfide (PPS), Glass Filled |
| Contact Material - Post: | Beryllium Copper |
| Contact Finish Thickness - Post: | 200.0µin (5.08µm) |
| Contact Finish - Post: | Tin |
| Pitch - Post: | 0.100" (2.54mm) |
| Series: | 57 |
| Features: | Closed Frame |
| Mounting Type: | Through Hole |
| Contact Material - Mating: | Beryllium Copper |
| Contact Finish Thickness - Mating: | 200.0µin (5.08µm) |
| Contact Finish - Mating: | Tin |
| Pitch - Mating: | 0.100" (2.54mm) |
| Number of Positions or Pins (Grid): | 36 (2 x 18) |
| Type: | DIP, ZIF (ZIP), 0.6" (15.24mm) Row Spacing |
| Part Status: | Active |
| Packaging: | Bulk |
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The 36-6572-10 is a socket designed for testing integrated or discrete semiconductors such as transistors and ICs. These pins can be used with both through hole and SMD components. It is designed to reduce damage to the component by avoiding direct contact between the tester and the part. The pins come in a variety of sizes to accommodate various components.
The 36-6572-10 is an ideal solution for testing and characterization of integrated or discrete semiconductors. It is easy to use and requires only minimal setup. It is also cost-effective, with the device being readily available and affordable.
The 36-6572-10 socket has a variety of features that make it a great choice for testing integrated or discrete semiconductors. The sockets provide an electrical shield, allowing for reliable testing. The pins are insulated, making the device ideal for temperature and current sensitive parts. In addition, the sockets feature a spring-loaded contact system to maintain the proper connection between the part and the pins.
The 36-6572-10 is also designed to be compatible with multiple test platforms. It can be used in conjunction with high frequency testing systems, allowing the user to quickly and accurately test integrated or discrete semiconductors. Additionally, the device is compatible with automated testing systems, providing a way to efficiently test multiple components in a single session.
The 36-6572-10 is an essential tool for testing and characterization of integrated or discrete semiconductors. It is designed to provide reliable results and to be easy to use. It is also cost-efficient and compatible with multiple test platforms. Its features make it an ideal solution for testing integrated or discrete semiconductors.
The specific data is subject to PDF, and the above content is for reference
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