416F40635ITR

416F40635ITR Application Field and Working Principle

Crystals are substances composed of an orderly arrangement of atoms or molecules into a geometric pattern. The 416F40635ITR is a general-purpose X-ray rocking crystal-diffractometer designed for analyzing a variety of materials including metals, alloys, ceramics, thin films, liquid crystals, and other materials. This instrument can measure a wide range of parameters, from basic crystallography to atomic-level measurements.

The 416F40635ITR utilizes an external X-ray tube to generate the X-ray beam, which is then focused on a sample mounted on the goniometric table. This rocking table contains a goniometer stage and a crystal holder, which houses the crystal that is being studied. The sample is rotated at various angles while X-ray diffracted waves are collected by the detector and sent to a computer system. The X-ray diffraction patterns are then analyzed by the computer and the crystallographic properties of the sample can be determined.

The 416F40635ITR is typically used to investigate the atomic-level structure of materials. It can be used to measure atomic positions, lattice parameters, and atomic sizes of crystalline materials. It can also measure other structural and chemical properties such as crystallite size, inter-atomic distances, strain, and bonding parameters. It can also be used for analyzing thin films and materials such as liquid crystals and polymers.

The 416F40635ITR is a versatile instrument with a wide range of applications in research and industry. Some examples of the types of materials and structures it can measure include thin films, nanocrystals, polymers, liquid crystals, and other materials. It can also be used for the study of surface structures, microstructures, and semiconductor materials. In addition, it can be used for the analysis of biological materials such as viruses and proteins.