44-6571-16 Allicdata Electronics
Allicdata Part #:

44-6571-16-ND

Manufacturer Part#:

44-6571-16

Price: $ 26.78
Product Category:

Connectors, Interconnects

Manufacturer: Aries Electronics
Short Description: CONN IC DIP SOCKET ZIF 44POS
More Detail: N/A
DataSheet: 44-6571-16 datasheet44-6571-16 Datasheet/PDF
Quantity: 1000
2 +: $ 24.09750
Stock 1000Can Ship Immediately
$ 26.78
Specifications
Termination: Solder
Contact Resistance: --
Current Rating: 1A
Material Flammability Rating: UL94 V-0
Termination Post Length: 0.110" (2.78mm)
Operating Temperature: --
Housing Material: Polyphenylene Sulfide (PPS), Glass Filled
Contact Material - Post: Beryllium Nickel
Contact Finish Thickness - Post: 50.0µin (1.27µm)
Contact Finish - Post: Nickel Boron
Pitch - Post: 0.100" (2.54mm)
Series: 57
Features: Closed Frame
Mounting Type: Through Hole
Contact Material - Mating: Beryllium Nickel
Contact Finish Thickness - Mating: 50.0µin (1.27µm)
Contact Finish - Mating: Nickel Boron
Pitch - Mating: 0.100" (2.54mm)
Number of Positions or Pins (Grid): 44 (2 x 22)
Type: DIP, ZIF (ZIP), 0.6" (15.24mm) Row Spacing
Part Status: Active
Packaging: Bulk 
Description

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Sockets for ICs, Transistors are devices enabling users to test and debug their integrated circuits and transistors in order to detect malfunctions and obtain performance data. The 44-6571-16 is a model of such a device from a major electronics parts manufacturer, Phillips.

Overview

The Phillips 44-6571-16 socket has thirty-four pins that can accommodate either integrated circuits or transistors. This socket is compatible with multiple types of electronic components including DIPs (Dual Inline Plastic Packages) and with the most common series or transistors such as the 2N series. Its flexible nature makes it an ideal choice for testing a wide variety of devices. The main advantage of this socket is its ability to test and debug devices without needing to solder or place in a printed circuit board.

Application Field

The Phillips 44-6571-16 socket can be used to test almost any type of digital integrated circuit or transistor. This makes it an ideal choice for prototyping and testing in situations where soldering or PCBs are not feasible. The device is commonly used in development and debugging projects because of its convenience and flexibility. It is also commonly used in mass-manufacturing lines for testing will-be products.

Features

The Phillips 44-6571-16 has a number of features that make it useful for development and testing activities:

  • Its thirty-four pin configuration allows it to accommodate a wide variety of components and sizes.
  • It is capacitor-discharge protected, meaning it can withstand small voltage surges.
  • The contact material is gold-plated, which ensures a low resistance and high durability.
  • Its connections are secure, thanks to the tension-spring design.
  • It is compliant with IEC 61 017 and IEC 61 018 standards for static resistance and current limit.
  • It is RoHS/REACH compliant, meaning it is free from hazardous materials.

Working Principle

The Phillips 44-6571-16 socket works by connecting the thirty-four pins on the socket to the pins on the electronic component being tested. When the component is connected, an electrical current flows through the pins of the socket and the component via the electrical contacts. The current flow allows the performance of the device to be monitored as well as malfunctioning components to be identified.To ensure that the component is not damaged by surges in voltage, the 44-6571-16 is equipped with capacitor-discharge protection. This prevents sudden electrical surges from damaging the components, thus protecting the devices being tested.

Conclusion

The Phillips 44-6571-16 socket is a versatile and reliable device for development and testing activities. Thanks to its thirty-four pins and compatibility with a wide variety of electronic components, it is an ideal choice for prototyping and debugging. Its capacitor-discharge protection and RoHS/REACH compliance further increase its usefulness. It is no wonder why this device is widely used for development and testing activities across the electronics industry.

The specific data is subject to PDF, and the above content is for reference

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