515-13-273-21-125002

Sockets for ICs, Transistors are widely used in many aspects of electronic engineering. 515-13-273-21-125002 is no exception. This socket is designed for efficient IC testing and offers excellent reliability and connectivity. Suitable IC application fields include logic, analog integrated circuits (ICs), power amplifiers and transistors.

Let’s see how this socket works. It is constructed with a graphite contact system that permits lower contact force during contact mating. This contact system is especially designed to ensure low wear and high reliability of the contact system. The contact system ensures that the required current is handled within the applicable limits. The socket also features an integrated electromechanical actuator, allowing effective switching of the ICs during IC tests. The actuator also ensures repeatable insertion and extraction of ICs.

This socket is much more durable than ordinary IC sockets and has excellent performance. It provides very low resistances, which is very important for accurate tests of ICs. In the case of power amplifiers and transistors, this socket achieves excellent signal quality by eliminating power consumption and heat loss.

It is also vital to the success of IC testing, that an optimal power supply connection is established. Luckily, this socket supports multiple power supply pins with a positive connection. These pins are designed to achieve a uniform power supply for the ICs. The actuator also provides an additional ground connection in case of testing high power ICs.

The 515-13-273-21-125002 Sockets for ICs, Transistors is a great solution for efficient IC testing. It provides excellent performance, reliability and connectivity, as well as low power consumption and heat loss. The graphite contact system and actuator also ensure accurate and repeatable connection and extraction of ICs. This socket is the best choice for power amplifiers and transistors, offering high signal quality. All in all, this is a great choice for efficient and reliable IC testing.