BK/ATC-TAP

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The BK/ATC-TAP application field and working principle provide an efficient way to interface test systems to systems under test (SUTs). It is an accessory used in a variety of communications systems, ranging from mobile phones, automotive systems, aerospace and defense, medical, robotics and other industrial systems. It includes a BK-ATC-151, ATC-155 and ATC-TAP modules.

The BK-ATC-151 is a bi-directional digital interface module capable of monitoring, controlling, configuring and diagnosing systems under test. It can read/write multiple digital and analog signals, as well as observe and control the internal state of digital components. It also can analyze trigger, status and event inputs, allowing users to quickly troubleshoot field problems. The ATC-155 is a bus-level digital interface module that can be used to access a number of different data buses, and it includes an integrated software package that can be used to capture and analyze bus data.

The ATC-TAP module is a special purpose interface module designed to provide diagnostic and debug information from systems under test, such as processor and memory addresses and data values. It can read and write to targets through the Test Access Port (TAP), giving it the capability to access registers, memory and control lines of controllers. The ATC-TAP also supports automated control functions, allowing for the easy implementation of debug and test procedures. For ATC-TAP compatible products, it can also be used as a general purpose interface.

The BK/ATC-TAP modules enable users to test, diagnose and debug digital systems quickly and accurately. It eliminates the need to physically hook up test leads, probe wires or use a logic analyzer, allowing users to gain full debug visibility without any additional hardware. The modules allow the user to remotely control and monitor any digital system, as well as analyze and debug issues at the hardware level. The hardware and software package makes the BK/ATC-TAP an ideal accessory for use in a wide range of digital systems, making it a vital component in digital system testing and troubleshooting.

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