BR24T04NUX-WTR

Series:	--
Packaging:	Tape & Reel (TR)
Part Status:	Active
Memory Type:	Non-Volatile
Memory Format:	EEPROM
Technology:	EEPROM
Memory Size:	4Kb (512 x 8)
Clock Frequency:	400kHz
Write Cycle Time - Word, Page:	5ms
Memory Interface:	I²C
Voltage - Supply:	1.6 V ~ 5.5 V
Operating Temperature:	-40°C ~ 85°C (TA)
Mounting Type:	Surface Mount
Package / Case:	8-UFDFN Exposed Pad
Supplier Device Package:	VSON008X2030
Base Part Number:	BR24T04

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Memory Application Field and Working Principle

Introduction

Memory technology is an essential infrastructure in today\'s digital world. Its application field is vast and pervasive, ranging from low-power embedded devices to traditional enterprise storage to high-performance supercomputing. The BR24T04NUX-WTR is a dual-ported memory module with powerful dynamic memory test capabilities, providing a comprehensive suite of solutions for Memory application field and meeting the steady rapid development in the world.

Application Field

BR24T04NUX-WTR has wide range of applicatons. On the low-power embedded device size, it can be used to cache memory products, such as video streaming products. It have wide range of support for games, as well as for car entertainment systems. It also be used for basic embedded processor or SoC applications on routers and switches, such as home routers and corporate switches. On the traditional enterprise storage size, it can be used for item storage, storage security and hard disk array models. With the development of big data technology, it also can be used to put a variety of applications that use IO technology, such as high-performance databases, large data systems and backup storage systems. Moreover, it also can be used in high-performance supercomputing field and also provides advanced memory solutions to industrial-grade processing, such as digital maritime, mine management, banking and more.

Working Principle

The BR24T04NUX-WTR\'s dual-ported memory module working principle is based on an advanced dynamic memory test technology. This technology utilizes a series of fail-safe in-line accuracy and off-chip test hardware to test the memory and improve memory performance. To ensure high precision of the test results, the module uses error-checking circuits to identify possible issues with the memory, as well as a power-saving technique for testing energy efficiency. Additionally, the module utilizes multiple interface types and logical architecture that enable thorough yet rapid testing of the memory.

Conclusion

BR24T04NUX-WTR is a powerful dual-ported memory module, providing comprehensive solutions that enable accurate and efficient testing of memory technology. Its application field is diverse, ranging from low-power embedded devices to high-performance supercomputing, meeting the needs of all enterprise and consumer applications. Its working principle is based on an advanced dynamic memory test technology with fail-safe in-line accuracy and off-chip test hardware for improved memory performance.

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