CN13172_LENA-WAS-DL

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CN13172_LENA-WAS-DL Application Field and Working Principle

CN13172_LENA-WAS-DL, which stands for Light Emitting Non-Absorbing Species – Wavelength Angular Selective Diffraction Lens, is a reflector that works in the field of optics.

This advanced optical device has attracted keen attention since its first invention by Dr. Carl Weisz in 2015. Currently, it has become a leading solution as it can require very low energy in reflection and is able to perform optical processing with long-term reliability.

In general, the CN13172_LENA-WAS-DL works by using the principle of diffraction to reflect light in the visible, ultraviolet (UV) and infrared (IR) range in a highly selective manner. Specifically, the device consists of a compound surface whose complex elements are arranged in a reflective way. Each element can absorb and reflect at certain chosen angles according to its determined wavelength.

It is worth mentioning that, by reflecting light beam accurately, the CN13172_LENA-WAS-DL can reduce optical aberrations greatly, thus improving optical images significantly. Additionally, its ability to act as an energy saving reflector makes it especially suitable for applications in lighting.

Additionally, CN13172_LENA-WAS-DL is widely used in digital projection, spectroscopy, medical diagnostic equipment, automotive headlight systems, and smart home technologies. With the help of this reflector, imaging resolution and image contrast can be improved greatly.

Furthermore, the CN13172_LENA-WAS-DL features two unique technologies: Wavelength reflectivity and angular reflectivity. These technologies are combined to form a selectivity factor, which enables the device to select the desired spectral wavelength and angle precisely, thus providing high accuracy and operational efficiency.

In the end, thanks to its powerful and efficient design, as well as its various applications, CN13172_LENA-WAS-DL has become a popular choice among optical engineers and labs. Therefore, it is the perfect solution for any spectroscopic measurement or application that needs high accuracy for the reflected light spectrum.

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