Allicdata Part #: | MMF003203-ND |
Manufacturer Part#: |
MMF003203 |
Price: | $ 42.67 |
Product Category: | Sensors, Transducers |
Manufacturer: | Micro-Measurements (Division of Vishay Precision Group) |
Short Description: | CEA-06-250UN-120 STRAIN GAGES (5 |
More Detail: | Linear Strain Gauge ±5% 0.250" (6.35mm) 0.120" (3.... |
DataSheet: | MMF003203 Datasheet/PDF |
Quantity: | 1000 |
1 +: | $ 38.78280 |
Series: | CEA |
Part Status: | Active |
Pattern Type: | Linear |
Strain Range: | ±5% |
Resistance: | 120 Ohms |
Resistance Tolerance: | ±0.3% |
Length - Active: | 0.250" (6.35mm) |
Length - Overall Pattern: | 0.415" (10.54mm) |
Length - Overall: | 0.52" (13.2mm) |
Width - Active: | 0.120" (3.05mm) |
Width - Overall Pattern: | 0.120" (3.05mm) |
Width - Overall: | 0.22" (5.6mm) |
Operating Temperature: | -100 ~ 350°F (-75 ~ 175°C) |
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Strain gauges are commonly used in various engineering applications to measure elastic deformation of a material. One such strain gauge is the MMF003203, which is a micro-mechanical strain gauge based on a monolithic twin-beam structure. This strain gauge is designed for applications wherein a compact, lightweight sensor is needed with excellent sensitivity and wide frequency response.
The MMF003203 strain gauge is composed of two beams that are connected in cantilever-like fashion via a spring element, and are built on a single silicon substrate. The two beams are made of polysilicon and are designed to have a different stiffness. Strain is applied to the device via the two beams, causing them to bend and pulverize the spring element. As the beams bend, the resistance across the strain gauge changes, resulting in a measurable change in the output.
The measuring principle of the MMF003203 strain gauge is based on the phenomenon called “piezoresistance”, whereby the resistance of a material changes when subjected to a strain. The strain gauge works by producing a measurable voltage across the two beams when strain is applied to them. This voltage is then measured and compared to a reference value to determine the amount of strain that the device is subjected to. This strain is then converted into a numeric value that can be used to measure a variety of different physical phenomena.
As an example, the MMF003203 strain gauge can be used to measure strain in structures. Engineers can use the device to measure the deformation of a structure under load, such as the stress on a bridge when a specific weight is placed on it. Furthermore, the device can be used for highly sensitive measurement applications, such as measuring changes in moisture levels in soil. In such applications, the strain gauge can be used to measure tiny changes in the deformation of the soil due to minute changes in the moisture content.
The MMF003203 strain gauge is a high-performance device that is suitable for a wide range of applications. Its monolithic twin-beam design enables the device to be compact and lightweight, while its piezoresistive effect provides excellent sensitivity and broad frequency response. It is also highly reliable, with the ability to withstand extreme temperatures and high strain without loss of accuracy or drift. This makes it an ideal device for applications in the semiconductor and automotive industries.
The specific data is subject to PDF, and the above content is for reference
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