| Allicdata Part #: | 402F200XXCKT-ND |
| Manufacturer Part#: |
402F200XXCKT |
| Price: | $ 0.00 |
| Product Category: | Crystals, Oscillators, Resonators |
| Manufacturer: | CTS-Frequency Controls |
| Short Description: | CRYSTAL 20.0000MHZ 8PF SMD |
| More Detail: | 20MHz ±15ppm Crystal 8pF 100 Ohms 4-SMD, No Lead |
| DataSheet: |  402F200XXCKT Datasheet/PDF |
| Quantity: | 1000 |
| 0 +: | $ 0.00000 |
Specifications
| Series: | 402 |
| Packaging: | Tape & Reel (TR) |
| Part Status: | Discontinued at Digi-Key |
| Type: | MHz Crystal |
| Frequency: | 20MHz |
| Frequency Stability: | ±15ppm |
| Frequency Tolerance: | ±15ppm |
| Load Capacitance: | 8pF |
| ESR (Equivalent Series Resistance): | 100 Ohms |
| Operating Mode: | Fundamental |
| Operating Temperature: | -20°C ~ 70°C |
| Ratings: | -- |
| Mounting Type: | Surface Mount |
| Package / Case: | 4-SMD, No Lead |
| Size / Dimension: | 0.079" L x 0.063" W (2.00mm x 1.60mm) |
| Height - Seated (Max): | 0.022" (0.55mm) |
Description
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407F200XXCKT crystals are sophisticated electronic sensors used to measure the electrical characteristics of semiconductor devices. The crystal is a miniature quartz crystal that measures the resistance, capacitance and inductance of a semiconductor device. The crystal\'s size and small footprint make it perfect for battery powered portable devices.407F200XXCKT crystals are designed to measure three different electrical characteristics of semiconductor devices. The objective of the sensor is to accurately measure and monitor the electrical characteristics of a semiconductor device such as resistivity, capacitance and inductance. 407F200XXCKT crystals can measure these values over a wide range of frequencies, making them ideal for applications such as power measurement and conditioning, optical communications and RF measurements.The 407F200XXCKT crystal works on the principle of crystallinity, or the ability of a material to carry an oscillating electric current. The crystal consists of two plates of quartz crystals separated by a thin dielectric material. When an electric current is applied to one of the plates, an oscillating current is created in the other plate due to the effect of the dielectric material. This oscillating current is measured by the 407F200XXCKT crystal, which is then used to calculate the resistance, capacitance and inductance of the semiconductor device.The 407F200XXCKT crystal is used extensively in precision diagnostic equipment, as it can measure the electrical characteristics of semiconductor devices with a high degree of accuracy. It is also used in application such as voltage, current, signal and power regulation and control, and power metering. The low power consumption and small size of the crystal make it ideal for applications where battery powered portable devices are used.In addition to its use in precision diagnostics and power regulation, the 407F200XXCKT crystal is also used in telecommunications, optical communicationdevices and RF measurement instruments. In RF test instruments, the crystal can be used to measure the frequency response of radio frequency devices. The crystal can also be used to measure the impedance and phase characteristics of radio frequency circuits.The 407F200XXCKT crystal is a powerful sensor capable of providing precise measurements of the electrical characteristics of semiconductor devices. It is small, lightweight and consumes low power. Its wide range of electrical measurement capabilities makes it suitable for use in various telecommunications, optical communication, RF measurements and power regulation applications.
The specific data is subject to PDF, and the above content is for reference
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