AR0140CS2M00AUEAH3-GEVB

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AR0140CS2M00AUEAH3-GEVB is an evaluation board for a high-definition, 1/2.8-inch complementary metal-oxide-semiconductor (CMOS) image sensor designed and manufactured by ON Semiconductor. The AR0140CS2M00AUEAH3-GEVB evaluation board includes multiple features that enable designers and engineers to quickly and accurately test the performance of their CMOS image sensors. This evaluation board is part of the growing family of Pro-Grade camera evaluation boards from ON Semiconductor, offering a wide range of performance evaluation options tailored to customer needs.

The AR0140CS2M00AUEAH3-GEVB evaluation board is optimized for the AR0140CS2M00AUEAH3 CMOS image sensor. It converts analog data to digital data, using an on-board hardware system in the form of an off-the-shelf single board computer. The computer includes an drivers, and application software for a variety of image analysis tasks. An Ethernet interface is provided as a standard connection method for monitoring and debugging data.

The evaluation board is designed to evaluate the features of the AR0140CS2M00AUEAH3 image sensor, including its imaging performance, pixel array size, wafer yield, production yield, and defect, non-uniformity or variation in performance. The image sensor can be programmed to enable advanced performance capability, such as white balance, adjustable timing, color reproduction, low noise, and anti-blooming.

The AR0140CS2M00AUEAH3-GEVB board is complete with all the necessary components for hardware evaluation. It includes an external regulator, a high-speed signal conditioning module, an adapter board, an I/O terminal board, image acquisition control board, a test probe, and a debugging cable set.

The AR0140CS2M00AUEAH3-GEVB evaluation board features two modes of operation makes it possible to either connect directly with a PC or connect through an Ethernet port. When connected directly with a PC, the user can manually control the evaluation board to observe various performance metrics, such as pixel array size, wafer yield, production yield, and defect. By using the Ethernet port, the user can develop their own automated tests for the image sensor.

The evaluation board also features a wide variety of software enabling remote operation, tag communication, image capture and analysis. The software packages provide users with the ability to configure, measure, and evaluate a variety of sensor parameters. The evaluation board can also be used to analyze image quality, artifact counts, and sensor calibration.

The AR0140CS2M00AUEAH3-GEVB evaluation board is an extremely efficient solution for the production of high-definition glasses-free 3D cameras by the stereoscopic imaging technique. This technology has enabled the development of numerous miniature 3D cameras with miniaturized lenses and electronic shutter control. With the AR0140CS2M00AUEAH3-GEVB board, engineers can quickly prototype and evaluate a variety of sensor performance metrics to ensure a high-definition 3D image quality.

By using the AR0140CS2M00AUEAH3-GEVB evaluation board, engineers can minimize the burden of manually changing hardware configurations or programming the image sensor in order to evaluate its performance. This board makes the entire process of evaluating the performance of the image sensor and its associated components significantly simpler. In addition, the board features comprehensive software support and integration capabilities which makes it an ideal choice for evaluating the performance of an ON Semiconductor CMOS image sensor.

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