ATS200C Allicdata Electronics
Allicdata Part #:

CTX909-ND

Manufacturer Part#:

ATS200C

Price: $ 0.25
Product Category:

Crystals, Oscillators, Resonators

Manufacturer: CTS-Frequency Controls
Short Description: CRYSTAL 20.0000MHZ 18PF T/H
More Detail: 20MHz ±30ppm Crystal 18pF 30 Ohms HC-49/US
DataSheet: ATS200C datasheetATS200C Datasheet/PDF
Quantity: 1881
1 +: $ 0.22680
10 +: $ 0.18900
50 +: $ 0.17010
100 +: $ 0.15120
500 +: $ 0.14364
1000 +: $ 0.12096
2500 +: $ 0.11340
5000 +: $ 0.10962
10000 +: $ 0.10584
Stock 1881Can Ship Immediately
$ 0.25
Specifications
Series: ATS
Packaging: Bulk 
Part Status: Active
Type: MHz Crystal
Frequency: 20MHz
Frequency Stability: ±50ppm
Frequency Tolerance: ±30ppm
Load Capacitance: 18pF
ESR (Equivalent Series Resistance): 30 Ohms
Operating Mode: Fundamental
Operating Temperature: -20°C ~ 70°C
Ratings: --
Mounting Type: Through Hole
Package / Case: HC-49/US
Size / Dimension: 0.427" L x 0.177" W (10.85mm x 4.50mm)
Height - Seated (Max): 0.145" (3.68mm)
Description

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

Crystals:

The ATS200C is a crysallographic tool that is used to measure the orientation and structure of diffraction patterns from materials. It was developed in the late 1980’s, with the aim of providing an easy and reliable way to measure the crystallographic properties of materials. It is now one of the most commonly used tools for measuring crystallography in research, industry, and education.

The basic principle of ATS200C is based on a technique known as X-ray diffraction. This technique uses brilliant X-ray beams to measure the angle and intensity of diffracted X-ray patterns from the material being analyzed. The resulting diffraction pattern is then used to calculate the orientation and structure of the material being analyzed.

The ATS200C utilizes two different types of diffraction patterns to measure the orientation and structure of a material. The first type is known as monochromatic diffraction, which measures the intensity of diffracted X-rays of a single wavelength. The second type is known as polychromatic diffraction, which measures the wavelength and intensity of diffracted X-rays of a range of wavelengths. These two types of diffraction patterns can be used together to determine the orientation and structure of a material.

The ATS200C has numerous applications in a variety of fields. In materials science, the device is used to measure the crystallographic properties of materials such as metals, ceramics, and polymers. Materials science researchers use the device to investigate the structure and properties of materials, as well as the growth and processing of new materials. In the field of basic science, the ATS200C can be used to measure the crystalline structure of proteins and other biological molecules.

The ATS200C is also used in the industrial sector for quality control and for determining the suitability of materials for specific applications. The device is used to detect anisotropy, or directional alignment, of a material, which is critical in the manufacture of components that need to perform in specific orientations or environments. The ATS200C is also used in the pharmaceutical industry to measure the crystallinity of active pharmaceutical ingredients.

The ATS200C is a highly versatile and reliable device that can be used in a variety of applications. Its ability to measure both monochromatic and polychromatic diffraction patterns allows it to measure a wide range of materials. Additionally, its ergonomic design makes it easy to use in almost any environment.

The specific data is subject to PDF, and the above content is for reference

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