C12948_LENA-WAS Optoelectronics

C12948_LENA-WAS Application Field and Working Principle

The C12948_LENA-WAS is a specialized reflector designed for applications in image analysis, photonics, and astronomy. Its primary purpose is to selectively reflect certain wavelengths of light, while transmitting other wavelengths. The reflector works on the principle of Bragg diffraction, which involves the reflection of light which is traveling in a specific direction of incident angle and which is at an appropriate wavelength.

When light approaches the reflector, it interacts with the sub-wavelength metallic gratings of the reflective surface. This allows the reflector to selectively reflect specific wavelengths of light. At the same time, other wavelengths of light are transmitted through the reflecting material. The grated surface of the reflector is what affects the angle of incidence of light and its resonance frequency. When the grated surface is changed, the amount of reflected light for a given wavelength also changes.

The C12948_LENA-WAS is mainly used for imaging applications. It can be used for analyzing the composition of materials, for wavelength filtering, and for resolving of imaging issues like chromatic aberration. It can also be used in astronomy for controlling the quality of optical systems, such as telescopes and spectrometers.

The reflector works well in both visible and near-infrared light ranges, with an exceptionally low distortion of 0.5%. Moreover, its surface is highly-resistant to corrosion and oxidation, making it suitable for use in demanding environments. It is also capable of standing up to ultraviolet radiation, extremely low temperatures, and extreme humidity and pressure.

The C12948_LENA-WAS reflector is a versatile and highly-reliable solution for a wide range of imaging applications. Its grated surface allows it to selectively reflect certain wavelengths of light, while transmitting other wavelengths. This makes it ideal for use in image analysis, photonics, and astronomy applications, where it can be used for wavelength filtering, for analyzing material compositions, and for resolving imaging issues.