CN12101_LENA-S

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CN12101_LENA-S is an advanced laser beam induction measuring system that has been widely used in many applications in the field of optics and reflectors. The system offers two main functions: measuring of laser beams reflected from objects or surfaces, and induction of laser pulses for measurement of laser power.

The CN12101_LENA-S system is based on the principles of laser beam reflection and laser induced fluorescence (LIF). In laser beam reflection, the optical system of the system functions as an reflector to acquire scattered light data from a reflective layer on the sample. The surface of the sample acts as a secondary reflector, providing scattered light from the first reflector, which is then measured by the system. The scattered light data can be used to calculate the exact optical properties of the sample, such as reflectivity, absorption, etc.

In laser induced fluorescence, the CN12101_LENA-S system utilizes laser light that is induced on certain samples to measure the intensity of the emitted light. This emitted light can then be used to calculate the amount of light that a given sample has absorbed, and to identify the photons present in the sample. The laser induced fluorescence can also be used to detect the presence of other contaminants such as dust and other substances that may interfere with the laser light beam.

The CN12101_LENA-S system is equipped with multiple laser sources which offer a variety of beam shapes and sizes. This feature helps to ensure that the correct shape and size of the beam is used in order to maximize accuracy of measurements. The laser sources can also be adjusted for different beam wavelengths in order to maximize accuracy when measuring certain types of materials.

In addition to its ability to measure laser beams reflected from surfaces, the CN12101_LENA-S system also has the capacity to measure concentrations of light emitters in a given sample. This includes both natural and artificial emitters, and allows for analysis of both air and water particles. Through the emission data, the system can provide information on the type and concentration of pollutants or other contaminants in a given sample.

The CN12101_LENA-S system can also be used to measure the reflectivity of materials in order to determine the strength of reflection of a given light source. This feature allows for accurate identification of materials that are reflective or not, and helps to improve accuracy of measurement in general.

The CN12101_LENA-S system is an advanced system with a variety of applications in the field of optics and reflectors. Its high accuracy and reliable performance make it a useful tool in many applications, and its ability to measure various types of light emitters make it an ideal choice for use in industrial and research projects.

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