CN12660_LENINA-M-DL

CN12660_LENINA-M-DL is an optical device used for reflectance measurement equipped with a template classifier. Its application field can be divided into three parts, namely infrared spectroscopy applications, fluorescence measurement applications and remote sensing applications.

Infrared Spectroscopy Applications

CN12660_LENINA-M-DL is suitable for nondestructive analysis of organic compounds and homogeneity testing of organic films. This reflective measurement device is insensitive to sample misalignment, vibration, and thermal effects, making it a great tool for quality assurance and process control.

Fluorescence Measurement Applications

The CN12660_LENINA-M-DL can be used as a fluorescence measurement device to measure the fluorescence intensity of certain materials. This type of application mainly includes applications such as the quantification of fluorescence quenching, fluorescence correlation spectroscopy and time-resolved fluorescence.

Remote Sensing Applications

The CN12660_LENINA-M-DL can also be used in remote sensing applications, such as ground-based remote sensing and airborne remote sensing. Ground-based remote sensing mainly includes measuring the reflectance of different vegetation and soil types in different spectral bands, while airborne remote sensing is mainly used for mapping and monitoring, including land use and surface feature identification.

Working Principle

The working principle of CN12660_LENINA-M-DL is based on the optical reflection measurement principle. In this principle, a light beam is projected from one side on to the sample surface. The reflected light is then measured by the device and its intensity is compared with the original light intensity. This difference is then used to calculate the reflectance of the sample surface. This device is capable of measuring the reflectance of a sample in the infrared range (up to 16 μm).