POC-W152-C11D-ATE

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The POC-W152-C11D-ATE is a failure analysis tool used in the field of microelectronics. It is designed to identify and analyze failures in integrated circuits (ICs). It is an Automated Test Equipment (ATE) used for fault diagnosis and debugging. The POC-W152-C11D-ATE provides a powerful set of features that enable engineers to quickly identify and correct faults in an array of ICs.

The POC-W152-C11D-ATE can be used in a variety of different applications ranging from system integration and verification to failure analysis. Additionally, it can be used in various research and development activities, such as chip design optimization, and verifying and debugging complex systems.

The POC-W152-C11D-ATE is a versatile instrument which provides a variety of test and measurement functions. It is capable of performing Serial Functional Test (SFT) and Pin Electrical Test (PET) on ICs. SFT involves capturing digital behaviors ofdislayed actual circuit states, and PETmeasures electrical parameters such as voltage and current. Additionally, it can detect open or short circuits, or detect patterns/timing.

The POC-W152-C11D-ATE has two major components: the mainframe and the test extender. The mainframe consists of the software interface, test fixture, FPGA, control board, probe station, and measurement and power modules. The test extender unit includes the DUT-port, power supply, and memory modules.

The software interface of the POC-W152-C11D-ATE is designed to provide a comprehensive range of functions. It allows users to prepare and control tests, detect and analyze faults, collect data, and generate reports. The mainframe is responsible for controlling the probe station, testing the DUT, and collecting and analyzing test data. The test extender unit is responsible for providing power to the DUTs, and for storing and preserving the test data.

The POC-W152-C11D-ATE utilizes a number of innovative technologies such as high-speed data processing, FPGA, and intelligent control to ensure accurate and reliable failure analysis. In addition, the software interface provides a large range of SCPI and user-defined commands for a wide range of automated tests.

Overall, the POC-W152-C11D-ATE is a versatile and powerful failure analysis tool. It is designed to meet the needs of engineers who require fast and reliable failure analysis of integrated circuits. The intuitive software interface, powerful features, and innovative technologies make it an ideal solution for a range of applications.

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