VL-MM7-4EBN

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VL-MM7-4EBN Application Field and Working Principle

The VL-MM7-4EBN is a specialized accessory for electron microscopy applications. This unit is designed to reduce the number of time-consuming and tedious manual adjustments in the scanning electron microscope (SEM) configuration. This advanced accessory eliminates many microscopy-set up tasks such as sample positioning, focus, specimen seating and other minor adjustments. The VL-MM7-4EBN helps to optimize SEM performance by ensuring repeatable and accurate results.

The VL-MM7-4EBN is composed of a load cell, a vacuum chamber, a focusing arm, a humidity chamber, a sample holder and a software package. The load cell is responsible for measuring the specimen force as it is moved down the sample holder by the focusing arm. The vacuum chamber is used to maintain a consistent vacuum in the sample stage and the humidity chamber is used to maintain a consistent humidity in the sample for better charging stability. If the sample surface contains any moisture, the chamber will prevent that moisture from entering the sample holder and causing damage to the specimen.

The software package is used to control the movements of the sample holder and the arm as well as to set the parameters for the focus. This advanced software package also comes with a calibration routine that allows users to quickly and accurately confirm the accuracy of the specimen force measurements. Additionally, it has the ability to data log the measured forces and other numerical values so that they can be analyzed later on.

The VL-MM7-4EBN optimizes the user\'s SEM applications by allowing for fewer manual adjustments and more accurate specimen positioning. This accessory also reduces the time and effort needed to configure the microscope, resulting in faster start-up times and improved productivity. With its advanced software package and load cell, the VL-MM7-4EBN is the perfect accessory for electron microscopy.

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