B9B136 Allicdata Electronics
Allicdata Part #:

BEL30445-ND

Manufacturer Part#:

B9B136

Price: $ 4.20
Product Category:

Uncategorized

Manufacturer: Belden Inc.
Short Description: BO2.0 18F OM1 OFNR-ZH TB
More Detail: Fiber Optic Cable
DataSheet: B9B136 datasheetB9B136 Datasheet/PDF
Quantity: 1000
1 +: $ 3.81780
Stock 1000Can Ship Immediately
$ 4.2
Specifications
Series: *
Part Status: Active
Description

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

The B9B136, or B9B, as it is commonly known, is a type of compact field-emission scanning electron microscope (SEM). With its versatile design and software features, B9B SEM is applicable in a wide range of research and industrial applications. In this article, we take a look at the features and working principle of the B9B SEM.

The B9B offers a combination of high performance, excellent imaging, and ease of use. The B9B is designed to be very versatile, and can be used in various applications, such as life science, materials science, and semiconductor applications. The B9B is designed for both low and high magnification applications, and is equipped with a low-angle tilt stage and automated stage movement for superior sample positioning. This allows users to quickly and easily adjust sample orientation and field of view.

In terms of imaging, the B9B\'s high-resolution imaging system is capable of producing images of specimens at resolutions as high as 10 nanometers. The B9B also features automated scanning control, which allows users to quickly map out large areas of a specimen. The B9B also features a range of software features to further enhance image quality and reproducibility. These features include automated image stitching, automated contrast adjustment, and automated background subtraction.

The working principle of the B9B SEM is based on the principles of electron optics. Electrons are generated in a vacuum chamber by an electron gun, then accelerated and focused onto a specimen. The specimen then emits secondary and backscattered electrons, which are then detected by the electron detector and converted into a digital image. The image is then further processed for digital analysis and display.

The B9B is an excellent choice for semiconductor applications due to its fast digital analysis capabilities, which allow for improved inspection and diagnosis of devices. The B9B is also used in metallurgical and mineralogical studies, for a wide range of applications from lithography to metallography and mineral mapping. In addition, the B9B SEM is used to research nanotechnology, as its extremely high resolution permits researchers to view objects at finer scales than previously possible.

Overall, the B9B SEM is an incredibly versatile tool, offering a range of features and software capabilities for a variety of applications. With its high resolution imaging capabilities, automated scanning and analysis, and its small size, the B9B is ideal for research or industrial applications.

The specific data is subject to PDF, and the above content is for reference

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