CJLRCAPIW-C Allicdata Electronics
Allicdata Part #:

298-13013-ND

Manufacturer Part#:

CJLRCAPIW-C

Price: $ 1.11
Product Category:

Uncategorized

Manufacturer: Panduit Corp
Short Description: CAT6 LEFT/RIGHT 45 DEGREE TG WIR
More Detail: N/A
DataSheet: CJLRCAPIW-C datasheetCJLRCAPIW-C Datasheet/PDF
Quantity: 500
1 +: $ 1.00170
10 +: $ 0.97398
25 +: $ 0.95634
50 +: $ 0.93026
100 +: $ 0.91287
500 +: $ 0.89548
1000 +: $ 0.87809
Stock 500Can Ship Immediately
$ 1.11
Specifications
Series: *
Part Status: Active
Description

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

CJLRCAPIW-C is an advanced computing device consisting of a combination of an infrared (IR) scanner and a laser ranging and coronagraph interference waveometer (LRCAP/IW) which works together to measure the optical properties of a wide range of materials. This device is highly versatile and can be used to measure the optical properties of any material or surface in a range of applications. It has been successfully used in various fields such as pharmaceutical science, astronomy, automotive engineering, pharmacy, agriculture, medicine, and other industries.

The CJLRCAPIW-C device provides superior precision in comparison to other measuring systems. It can produce extremely accurate spectral values, temperature readings, and relative humidity measurements without operator influence. The device also has the capability to differentiate between proteins, organic materials, minerals, and other substances as well as materials with a range of optical absorption and transmission characteristics.

The operating principle of CJLRCAPIW-C is relatively simple. It works by using the IR scanner to scan a sample and measure the wave length of emitted radiation. The LRCAP/IW then uses its own software to measure the wave lengths of reflected or transmitted light from the sample. The device can then calculate the optical properties of the material or surface based on the measured values.

The primary application field for CJLRCAPIW-C is in the industrial sector, where it is used to measure the optical properties of materials, products and components for quality assurance in production processes. It is also used in laboratories to study the optical properties of materials for research studies. In addition, the device is widely used for creating 3D models, measuring components in medical apparatus, as well as in meteorology, archaeology and remote sensing.

The CJLRCAPIW-C device is an advanced and highly accurate tool for measuring the optical properties of any material. It is robust, reliable and easy to use, and its wide range of applications and superior performance makes it a key component in many industrial and scientific processes.

The specific data is subject to PDF, and the above content is for reference

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