CMRPYIG

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

Computer magnetic resonance force microscopy (CMRPYIG) is an emerging scanning probe microscopy technique developed in recent years. It combines the advantages of magnetic resonance imaging (MRI) with the nanoscale precision of scanning probe microscopy (SPM). CMRPYIG provides sub-angstrom resolution and can be used to measure the magnetic properties of a sample on a microscopic level. In this article, we will discuss the application fields and working principle of CMRPYIG.

CMRPYIG is a powerful tool for investigating the structure-property relationships of nanomaterials. It can be used to study magnetism-induced properties such as magnetization, electrical conductivity, and magneto-optical effects. It is possible to measure and control the spin-spin interactions between two magnetic moments, allowing for further characterization of magnetic materials. Also, it is possible to measure the spin system temperature distribution with nanoscale resolution and with sensitivity to magnetic fields and fermion densities that are not achievable with conventional MRI techniques.

CMRPYIG can be used in the fields of materials science, biophysics, chemistry, and nanotechnology. For example, it can be used to study the magnetic properties of a material, such as magnetization and magneto-optical effects. It can also be used to investigate the electronic structure of nanostructures, analyze magnetic processes in biochemical processes, and measure biological sample properties such as the size of cells and proteins. Furthermore, CMRPYIG can be used to study the structure-property relationships of nanomaterials, as well as to study the magnetic properties of quantum dots, proteins, and other nanomaterials.

The working principle of CMRPYIG is based on electron tunneling between a magnetically susceptible surface and an atomic-scale magnetic tip. Using a technique known as scanning tunneling microscope (STM), the force interactions between the tip and the surface can be measured. The magnetic field generated by the STM tip is then used to interact with the surface and measure local magnetic properties.

The CMRPYIG technique uses a three-layer sample structure consisting of an insulating layer, an intermediate metallic layer, and a ferromagnetic surface. The presence of a magnetic tip interacts with the surface, resulting in a spin-dependent tunneling conductance (or tunneling magnetoresistance). By measuring the tunneling transport current, the surface magnetic properties can be determined.

The CMRPYIG technique is used to measure small changes in the magnetic properties of the sample as a result of different external and internal conditions, such as temperature, pressure, chemical or biological processes, or magnetic fields. For example, the technique can be used to measure the magnetic properties of materials at the nanometer-scale, which is not possible with other techniques. Furthermore, CMRPYIG can be used to investigate the influence of external magnetic fields on the magnetic properties of a sample.

In conclusion, CMRPYIG is a powerful tool for studying the structure-property relationships of nanomaterials. It provides sub-angstrom resolution and can be used to measure magnetic properties of materials at the nanometer-scale. It can be used to investigate the influence of external magnetic fields on the magnetic properties of a sample, as well as to study magnetism-induced properties such as magnetization, electrical conductivity, and magneto-optical effects. Its versatile capabilities and flexibility make it suitable for use in a wide range of application fields.

The specific data is subject to PDF, and the above content is for reference