JMACT-26XPS

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

JMACT-26XPS is a versatile device with a wide range of uses. It is a surface analysis instrument that combines Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS) into one compact package. With the ability to analyze a variety of materials, the JMACT-26XPS is a powerful tool for the analysis of both organic and inorganic materials.

The core technology of JMACT-26XPS lies within its electron gun and electron column. The electron gun is capable of producing electrons with energy up to 1.5 keV and the electron column is capable of collecting and focusing the high kinetic energy of these electrons. The combination of these two components works together to provide a high-resolution image of the material’s surface, showing its chemical structure in great detail.

Due to its ability to detect and localize elements on the atomic level, the JMACT-26XPS can be used for a wide variety of applications. For materials science, it can be used to analyze the oxidation, corrosion, and wear-resistance of different materials; it can also be used to identify the chemical composition of a sample and determine its crystallinity. For condensing systems, the JMACT-26XPS can be used to measure the thickness of metallic films, allowing for better control over the size of the film. For corrosion studies, the instrument can be used to obtain a comprehensive picture of the surface environment. Finally, the TMACT-26XPS can also be used for the analysis of contaminants on surfaces.

In terms of operation, the JMACT-26XPS is quite easy to use. First, the sample is loaded into the chamber via a sample handling robot. The robot places the sample in the chamber and aligns it with the electron beam. Following this, the analytical parameters of the experiment are set up. These parameters can include the energy of the electrons, the pressure of the chamber, the acquisition time, the data acquisition rate, and several other parameters. After this, the experiment can be run and the data collected.

The data collected by the JMACT-26XPS is then analyzed to obtain the desired information about the sample. Depending on the application, the data can be further processed to extract the desired features. For example, for corrosion studies, the data can be analyzed to determine the depth and extent of the corrosion. For materials science studies, the data can be used to assess the uniformity and crystallinity of the sample.

The JMACT-26XPS is a powerful and versatile tool for conducting a variety of surface analysis applications. With its ability to analyze a variety of materials, the instrument is capable of acquiring a high level of resolution while also providing the necessary sensitivity. This makes the JMACT-26XPS an ideal choice for a wide variety of research and industrial applications.

The specific data is subject to PDF, and the above content is for reference