MXD1210CSA+T

Memory-Controllers: MXD1210CSA+T Application Field and Working Principle

The MXD1210CSA+T is a memory-controller designed for single-event upsets (SEUs) and static RAMs (SRAMs) that require radiation hardened functionality. The device is a quad-register, dual-port, Dual Clock with onboard error detection logic for the memory array and register files. It is compatible with single-event-upset-hardened SRAM devices, including GSRAM and MCM SRAM, as well as fault-tolerant packages in the market. This device provides an efficient and fault-resistant solution to memory-related events.

Overview

The MXD1210CSA+T operates with two separate clock inputs, and is designed to provide error detection logic for single-event upset (SEU) tolerant SRAMs. It is also designed to provide protection against dangerous multiple-event upsets (MEUs) by using 3-multiplexed logic sets. It contains a quad register file with two 32-bit registers which are stored for comparison with the memory buses, and two 64-bit registers for the main data port memories. The device also contains error detection logic for SBE and SEU faults, such as data validation and CRC checkers, parity checkers, dedicated error comparators, and maskable bit-error-based fuzzy logic.

The MXD1210CSA+T device is powered by an onboard 5V supply and includes an on-chip voltage regulator as well as an optional on-chip phase-locked loop (PLL) to synchronize the device with the external clock inputs. The device features a self-refrsh logic module to ensure the data retention, and provides a programmable clock gating system which can be used to reduce power consumption in return for increased latency.

Key Features

The MXD1210CSA+T provides several key features that make it an excellent memory-controller for SEU tolerant SRAMs. These include:

• Dual-clock operational mode, allowing the device to compare two sets of input data from two separate clocks
• On-chip voltage-regulator and PLL for synchronization with external clock inputs
• Self-refresh logic module for improved data retention
• Programmable clock gating system for reduced power consumption
• Error detection logic for SBE and SEU faults, including data validation and CRC checkers, parity checkers, dedicated error comparators and maskable bit-error-based fuzzy logic.

Application Field

The MXD1210CSA+T is designed to provide on-board error detection and prevention for SEU tolerant SRAMs. These devices are often used in applications that require operations in harsh, high-radiation environments such as spacecraft, aircraft and other military and heavy industrial equipment. With its onboard error detection and prevention features, it is ideal for use in these types of applications.

Working Principle

The MXD1210CSA+T device operates with two separate clock inputs, and is designed to provide error detection logic for single-event upsets (SEU). The device contains a quad register file with two 32-bit registers which are stored for comparison with the memory buses, and two 64-bit registers for the main data port memories. It also contains error detection logic for SBE and SEU faults, such as data validation and CRC checkers, parity checkers, dedicated error comparators, and maskable bit-error-based fuzzy logic. The device is powered by an onboard 5V supply and includes an on-chip voltage regulator as well as an optional on-chip phase-locked loop (PLL) to synchronize the device with the external clock inputs.

The device also has a self-refresh logic module for improved data retention, as well as a programmable clock gating system for power saving. The clock gating system can be used to reduce power consumption in return for increased latency. The MXD1210CSA+T is capable of providing error detection logic for radiation hardened SRAMs, and can detect and prevent SBE and SEU faults.