NK588MRDY

Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us:   sales@allicdata.com

NK588MRDY is a comprehensive test instrument for testing the physical, mechanical and electrical properties of semiconductors and dielectric materials. This instrument is used to measure the thermal properties of semiconductor substrates, such as film thickness, sheet resistance, dielectric constant, insulation resistance, dielectric strength, permittivity and impedance. It is equipped with a slicing and cutting machine to obtain the samples or wafers for the measurements, and has the capability of surface-mount testing in a variety of testing configurations.

The application field of the NK588MRDY is mainly in the semiconductor device research and test. It can be used for the characterization of a variety of semiconductor material properties. For example, it can be used for the evaluation of the electrical, mechanical and thermal properties of various semiconductor devices like memory chips, logic circuits, transistor-diodes, and light-emitting diodes (LEDs). It can also be used for the evaluation of the physical and electrical characteristics of wafers and other materials used in microelectronics.

The working principle of the NK588MRDY is based on the principles of thermal constriction and the dielectric relaxation method. The first principle is used to measure the physical properties of semiconductor substrates like thickness, sheet resistance, dielectric constant, insulation resistance, dielectric strength, permittivity, and impedance. On the other hand, the second principle is used to measure the electrical properties of transistors, diodes, integrated circuits, etc.

In addition to physical and electrical measurements, the NK588MRDY also offers more advanced features such as thermal characterization, surface-mount testing, and process monitoring. The instrument is capable of providing accurate and repeatable measurements of physical, mechanical and electrical properties of a variety of materials. It has an automated thermal sensing system and can detect changes in the temperature of the sample material. It also features advanced algorithms for process monitoring, especially in monitoring the fabrication of advanced semiconductor materials.

The NK588MRDY is a widely used test instrument for the characterization and testing of semiconductor materials. The instrument has a versatile design and can perform various types of tests in order to analyze different aspects of semiconductor and dielectric materials. It has excellent accuracy, repeatability and reliability, which makes it suitable for a variety of research and testing applications in the field of microelectronics. This makes it a useful tool for the research and development of many semiconductor and microelectronic products.

The specific data is subject to PDF, and the above content is for reference