SN74LV573ARGYRG4

SN74LV573ARGYRG4 as a member of the Logic- Latches family solution is a high performance 8-bit register. It is fabricated by the advanced silicon-gate C2MOS technology. The device features data retention during power-down and hot insertion, making it well suitable for automated test equipment and data acquisition applications.

The SN74LV573ARGYRG4 consists of a latch array and a multiplexer array. The latch array is composed of eight D-type latches that store data and address bits. The data lines D0 through D7 determine the proportion of the address bits to the control signals Z0, Z1 and Z2. The multiplexer array selects and routes data/address bits to the outputs. The three control signals Z0, Z1, Z2 form the multiplexer selection code.

At the output, SN74LV573ARGYRG4 provides eight, three-state outputs. Its output pins can be individually latched when the latch enable signal, LE, is high. When the latch enable signal is low, all the outputs hold the data that is currently being presented at its input.

SN74LV573ARGYRG4 features typical access times of 7 ns MAX and active current of 8.2 mA MAX. As a logic-latches solution, it operates with a minimum power supply voltages of 1.8 V and supports a wide range up to 3.6 V. It also has a low standby current of 1.1 μA and wide operating temperature range from -40 to 85 ℃. In addition, it withstands strong electromagnetic interference, enabling it to be used in challenging environments.

The SN74LV573ARGYRG4 is widely used in date processing systems, data acquisition devices and automated test equipment. It helps to store and protect digital information and provide an efficient switch in piping and fanning data paths.

In conclusion, SN74LV573ARGYRG4 is an 8-bit register with latch array and multiplexer array that belongs to the Logic-Latches family solution. It provides high performance with enhanced speed and low current consumption with minimized power consumption. It is ideal for applications including date processing systems, data acquisition devices and automated test equipment.