Allicdata Part #: | SX9000IGBTT-ND |
Manufacturer Part#: |
SX9000IGBTT |
Price: | $ 0.00 |
Product Category: | Uncategorized |
Manufacturer: | Semtech Corporation |
Short Description: | IC AFE CAP SENSE 256WLCSP |
More Detail: | N/A |
DataSheet: | SX9000IGBTT Datasheet/PDF |
Quantity: | 1000 |
1 +: | 0.00000 |
Series: | * |
Part Status: | Obsolete |
Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us: sales@allicdata.com
The Sx9000IGBT Tester is a programmable system and test platform used for testing electronic components to guarantee the reliability of the product. It features a fully automated testing procedure, including both basic and advanced tests for a wide range of applications in the FPGA/ICs/SSI/SoC market.
The Sx9000IGBT Tester is widely used in the semiconductor industry, covering a wide range of applications including: testing of digital, analog and mixed signal semiconductors, system design and validation, manufacturing and verification, device characterization, digital interface and system interconnect testing.
The Sx9000IGBT Tester integrates various technologies, such as boundary scan, in-circuit emulation, high precision analog measurement, programmable logic and power consumption, to test a wide array of semiconductor devices. It provides a reliable testing platform with complete functional coverage to ensure the proper function of the tested device.
The Sx9000IGBT Tester utilizes a unique testing methodology, dubbed TLP or Time Limited Protocol. This protocol has been developed to provide fast but accurate testing, with the capability to complete the testing in a short time frame. With this protocol, the testing time is divided into two different phases. The first phase is the data acquisition phase, which includes the initial connection of the tester to the device, the test setup and the start of the data acquisition. During this phase, the tester will probe for certain signals on the device, while simultaneously acquiring and storing the test data. The second phase of the testing procedure is the data analysis phase, which includes the extraction of the test results, validation of the results and the conclusion of the test process.
In addition, the Sx9000IGBT Tester provides advance testing capabilities including: the ability to test multiple devices in parallel, advanced test sequence design and flexibility for test parameter settings. Its user interface can be tailored to the needs of the individual user, making the system easier to use. Furthermore, the system provides comprehensive documentation, tutorials and support to enable users to work with the system with minimal effort.
In conclusion, the Sx9000IGBT Tester is an advanced test system specifically designed for testing semiconductor devices. It utilizes a unique testing protocol, which enables fast but accurate testing. In addition, its programmable logic and power consumption controlling make it versatile and suitable for a wide range of applications in the FPGA/ICs/SSI/SoC market. With its reliable testing platform and comprehensive user support, the Sx9000IGBT Tester is an essential tool for ensuring the reliability of semiconductor products.
The specific data is subject to PDF, and the above content is for reference
Part Number | Manufacturer | Price | Quantity | Description |
---|
SX9000ICSTRT | Semtech Corp... | 0.0 $ | 1000 | IC AFE CAP SENSE 256WLCSP |
SX9000IGBTRT | Semtech Corp... | 0.0 $ | 1000 | IC AFE CAP SENSE 256WLCSP |
SX9000IGBTT | Semtech Corp... | 0.0 $ | 1000 | IC AFE CAP SENSE 256WLCSP |
SX9001ICSTRT | Semtech Corp... | 0.0 $ | 1000 | IC AFE CAP SENSE 256WLCSP |
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