TLC3702QPWRQ1 Allicdata Electronics
Allicdata Part #:

296-36985-2-ND

Manufacturer Part#:

TLC3702QPWRQ1

Price: $ 0.00
Product Category:

Integrated Circuits (ICs)

Manufacturer: Texas Instruments
Short Description: IC V COMPARATR LINCMOS DL 8TSSOPComparator General...
More Detail: N/A
DataSheet: TLC3702QPWRQ1 datasheetTLC3702QPWRQ1 Datasheet/PDF
Quantity: 26000
Lead Free Status / RoHS Status: ROHS3 Compliant
Moisture Sensitivity Level (MSL): 3 (168 Hours)
Stock 26000Can Ship Immediately
Specifications
Series: Automotive, AEC-Q100, LinCMOS™
Packaging: Tape & Reel (TR) 
Lead Free Status / RoHS Status: --
Part Status: Active
Moisture Sensitivity Level (MSL): --
Type: General Purpose
Number of Elements: 2
Output Type: CMOS, Push-Pull, TTL
Voltage - Supply, Single/Dual (±): 4 V ~ 16 V
Voltage - Input Offset (Max): 5mV @ 10V
Current - Input Bias (Max): 5pA @ 5V
Current - Output (Typ): 20mA
Current - Quiescent (Max): 40µA
CMRR, PSRR (Typ): 84dB CMRR
Propagation Delay (Max): 4.5µs
Hysteresis: --
Operating Temperature: -40°C ~ 125°C
Package / Case: 8-TSSOP (0.173", 4.40mm Width)
Mounting Type: Surface Mount
Supplier Device Package: 8-TSSOP
Base Part Number: TLC3702
Description

Due to market price fluctuations,if you need to purchase or consult the price.You can contact us or emial to us:   sales@allicdata.com


1. Describe

The TLC3702QPWRQ1 consists of two independent micropower voltage comparators. compared to similar device, the TLC3702-Q1 uses one-twentieth Power similar response time. This allows The device reacts quickly to rapidly changing signals, while Extend battery life. Push-Pull CMOS Output Stage Drive Capacitors Direct loading, no power pull-up required resistor to achieve the specified response time. Eliminating pull-up resistors not only reduces power consumption dissipative, but also saves board space and component cost. In addition, the output stage is fully Compatible with all TTL and CMOS logic Require. Available on Texas Instruments' LinCMOS™ process Better than standard CMOS analog performance Works with standard CMOS processes. has the advantage of low power consumption without sacrificing speed, high input impedance and low bias current, LinCMOS process provides extremely stable input/offset Voltages with large differential input voltages. this feature makes it possible to build reliable CMOS comparator. TLC3702-Q1 has a wide supply range of 3V to 16 V, allowing design flexibility. voltage range Also allows the device to handle start and stop application and connect directly to a standard 12V battery. All these features make TLC3702-Q1 for HEV/EV and powertrain Systems such as Transmission Control Units (TCUs) engine control.

2. Feature

    1. Compliant with automotive application requirements

    2. AEC-Q100 certified with the following results:

        – Device Temperature Grade 1: –40°C to +125°C ambient operating temperature scope

        – Device HBM ESD classification level H2 

        – Equipment CDM ESD classification level C4B

    3. Push-Pull CMOS Output Drives Capacitive Loads Without pull-up resistor, IO = ± 8 mA

    4. Very low power...100 µW (typ, 5 V)

    5. Fast response time... tPLH = 2.7 µs (typ) 5mV overdrive

    6. Single supply operation…3 V to 16 V

    7. On-chip ESD protection

3. Application

    1. Transmission control unit

    2. braking

    3. Engine Control

4. Pin configuration

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5. Pin Description

image.png

6. Application Information

The inputs should always remain within the supply rails to avoid forward biasing the diodes in the electrostatic discharge (ESD) protection structure. If either input exceeds this range, the device is not damaged as long as the input is limited to less than 5 mA. To maintain the expected output state, the inputs must remain within the common-mode range. For example, at 25°C with VDD = 5 V, both inputs must remain between –0.2 V and 4 V to ensure proper device operation. To ensure reliable operation, the supply should be decoupled with a capacitor (0.1 µF) that is positioned as close to the device as possible. The TLC3702-Q1 has internal ESD-protection circuits that prevent functional failures at voltages up to 2000 V as tested under MIL-STD-883C, Method 3015.2; however, care should be exercised in handling these devices as exposure to ESD may result in the degradation of the device parametric performance.


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