Allicdata Part #: | TPSFH-CW-ND |
Manufacturer Part#: |
TPSFH-CW |
Price: | $ 10.75 |
Product Category: | Uncategorized |
Manufacturer: | Eaton |
Short Description: | SPARE FUSEHOLDER |
More Detail: | N/A |
DataSheet: | TPSFH-CW Datasheet/PDF |
Quantity: | 1000 |
50 +: | $ 9.77949 |
Series: | * |
Part Status: | Active |
Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us: sales@allicdata.com
The TPSFH-CW (Tunable Pulse Shaped Femtosecond-Continuous Wave) combination offers a powerful way to study the properties of materials in many engineering and scientific applications. This combination was first developed by Oelectron and has been commercialized by OE Labs. TPSFH-CW is a system designed to provide both spectroscopic and morphological properties of material in a single measurement. The TPSFH-CW system is composed of three main components: the pulse shaper, a continuous-wave laser, and a power meter.
The pulse shaper is responsible for generating a diverse range of pulse shapes, from femtoseconds to nanoseconds. This allows for precise control of the pulse duration, amplitude, and frequency. The pulse shaper also includes features that allow for compensation of dispersion, which can cause distortion of the pulse as it is transmitted through the sample.
The continuous-wave laser generates a continuous-wave beam that is used to excite the sample. The continuous-wave laser is typically a medium power laser and can produce wavelengths from the infrared to the ultraviolet. The power of the laser can be tuned to ensure the optimal performance of the system. It is important to note that the continuous-wave laser is the primary source of energy for the experiment.
The power meter is used to measure the power of the laser beam after it has interacted with the sample. This allows for the characterization of the material’s optical properties. The power meter also provides feedback on the alignment and calibration of the system, to ensure optimal performance.
The working principle of the TPSFH-CW system is based on the principles of nonlinear optics and spectroscopy. By applying a pulse of femtosecond duration to a sample, nonlinear interaction with the material occurs. This interaction can be used to reveal information about the material’s properties such as its molecular structure and composition. Furthermore, by scanning the laser across the sample, the morphological characteristics of the sample can be determined.
The TPSFH-CW combination has a wide range of applications in various scientific and engineering fields. In chemistry and biology, the combination can be used to characterize the optical properties of a wide range of samples, including proteins, DNA, and other biomolecules. In materials science and engineering, the combination can be used to measure the properties of materials such as coatings and thin films. In optical sensing and spectroscopy, the TPSFH-CW combination can be used to measure the refractive index, absorption coefficient, dispersion, and fluorescence of materials. Finally, the combination can also be used in microscopy to measure the surface topography of a sample.
The TPSFH-CW combination is a powerful tool that can be used in many fields of science and engineering to gain insight into the properties of materials. It is a powerful tool that can be used to study the optical, spectroscopic, and morphological properties of samples. With its versatile range of applications, the TPSFH-CW combination is an ideal tool for those who wish to study the properties of materials.
The specific data is subject to PDF, and the above content is for reference
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