ZKHXS1145WH9

The ZKHXS1145WH9 is a versatile and sophisticated device that can be used in a variety of applications.

The ZKHXS1145WH9 is a high-speed optical interferometer that combines laser fringe reduction technology with a highly sensitive charge-coupled device (CCD) detector. The device can measure position, displacement, distance, and surface morphological changes with high accuracy and resolution.

The ZKHXS1145WH9 has several advantages compared to traditional position measurement devices. It is much faster, has greater precision, and is easier to use. Additionally, the device is highly reliable and durable, making it suitable for use in harsh environments.

The ZKHXS1145WH9 is a popular choice for many applications because of its accuracy and versatility. It is often used in non-contact displacement measurement, automated process monitoring, laser hole drilling, machining tool positioning, and laser material processing.

In terms of working principle, the ZKHXS1145WH9 utilizes an optical interferometer system to measure surface morphological changes. This optical interferometer consists of two beams from a laser source. These two beams are then modulated at their respective peak frequencies, and the resulting interference pattern is captured by the CCD detector. This interference pattern is then processed by the device’s algorithms, and the exact position or distance of the surface morphological change can be calculated.

The ZKHXS1145WH9 is an efficient and reliable device that can be used in a variety of applications. Its optical interferometer system makes it very accurate and reliable, and its versatility makes it a popular choice for many applications.