AT24C512C-SSHM-T Integrated Circuits (ICs)

Description

The AT24C512C provides 524,288 bits of Serial Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 65,536 words of 8 bits each. The device’s cascading feature allows up to eight devices to

share a common two‑wire bus. The device is optimized for use in many industrial and commercial applications where low‑power and low‑voltage operation are essential. The devices are available in space‑saving 8‑lead SOIC, 8‑lead SOIJ, 8‑lead TSSOP, 8‑pad UDFN, 8-ball WLCSP and 8‑ball VFBGA packages. All packages operate from 1.7V to 3.6V or 2.5V to 5.5V.

Features

    1. Low-voltage and Standard-voltage Operation

        - VCC = 1.7V to 3.6V

        - VCC = 2.5V to 5.5V

    2. Internally Organized as 65,536 x 8 (512K)

    3. I2 C-Compatible (2-Wire) Serial Interface

    4. Schmitt Triggers, Filtered Inputs for Noise Suppression

    5. Bidirectional Data Transfer Protocol

    6. 400kHz (1.7V) and 1MHz (2.5V, 5.5V) Compatibility

    7. Write Protect Pin for Hardware Data Protection

    8. 128-byte Page Write Mode

           ̶ Partial Page Writes Allowed

    9. Random and Sequential Read Modes

  10. Self-timed Write Cycle (5ms Max)

  11. High Reliability

        - Endurance: 1,000,000 Write Cycles

        - Data Retention: 40 Years

  12. Green Package Options (Pb/Halide-free/RoHS Compliant)

         - 8-lead JEDEC SOIC, 8-lead EIAJ SOIC, 8-lead TSSOP, 8-pad UDFN, 8-ball WLCSP, and 8-ball VFBGA Packages

  13. Die sale Options: Wafer Form and Tape and Reel Available

Absolute Maximum Ratings

    1. Temperature under bias： -55°C to +125°C

    2. Storage temperature： -65°C to +150°C

    3. VCC： 6.25V

    4. Voltage on any pin with respect to ground： -1.0V to +7.0V

    5. DC output current： 5.0 mA

    6. ESD protection： > 4 kV

Note:  Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.

This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.