Allicdata Part #: | 28503869A-ND |
Manufacturer Part#: |
28503869 A |
Price: | $ 0.00 |
Product Category: | Uncategorized |
Manufacturer: | Cypress Semiconductor Corp |
Short Description: | IC FLASH |
More Detail: | N/A |
DataSheet: | 28503869 A Datasheet/PDF |
Quantity: | 1000 |
1 +: | 0.00000 |
Series: | * |
Part Status: | Last Time Buy |
Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us: sales@allicdata.com
Micro e-beam systems are becoming increasingly popular, and for good reason: their capabilities can be used in numerous applications. These systems allow for rapid, accurate, precise measurements of electrical properties with minimal set-up time and cost. For this reason, they are particularly useful in research and development, diagnosis and inspection of materials, and in industrial automation. In this article, we’ll take a look at the 28503869 Micro E-Beam System and discuss its application field and working principle.
The 28503869 Micro E-Beam System is based on the proven micro-e-beam technology, with features that have been modified and tuned to meet the specific requirements of industrial applications. This device is made up of three main components: an electron source, an electron detector, and a control unit. The electron source emits electrons through a focused field gradient which is then detected by the electron detector. The control unit is used to control the beam parameters, such as the voltage and current, as well as adjust the focus of the beam.
This Micro E-Beam System can be used in various industrial applications. It can be used for the inspection and measurement of both insulation and conductive materials, such as wires and cables. It can also be used to detect flaws in materials, as well as to measure electrical properties of materials, such as resistance and capacitance. Additionally, it can be used for failure analysis, quality control, surface characterization, and thin-film measuring, among other tasks.
The 28503869 Micro E-Beam System works on the principle of electrostatic fields that are generated by two conductive electrodes. The voltage applied to the electrodes produces an electric field, which then accelerates free electrons from the source towards the detector. The current measured by the detector is then used to calculate various electrical properties. The system is highly sensitive and is able to detect small changes in the electrical properties of materials.
The 28503869 Micro E-Beam System also has several features that make it suitable for industrial applications. For example, it has an adjustable beam intensity setting, which allows for accurate and precise measurements. Additionally, it has an automated calibration and adjustment system, which ensures consistent accuracy of the measurements. Lastly, it has a user-friendly interface that allows for easy control of the micro-e-beam.
In conclusion, the 28503869 Micro E-Beam System is a highly versatile device that is suitable for a variety of industrial applications. Its ability to measure and detect small changes in electrical properties makes it particularly useful in research and development, as well as in quality control and failure analysis. The system’s adjustable beam intensity setting and automated calibration make it easy to set up and use. Furthermore, its user-friendly interface makes the system user-friendly, allowing for easy control and adjustment of the beam.
The specific data is subject to PDF, and the above content is for reference
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DIODE GENERAL PURPOSE TO220
CB 6C 6#16 SKT RECP
CA08COME36-3PB-44
CA-BAYONET
CB 6C 6#16S SKT PLUG
CAC 3C 3#16S SKT RECP LINE