2LP27

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2LP27 is a kind of probe microscope used in nanoscale measurements and analyses. It is specially designed for nanoscale structures and samples with highest precision requirements. This kind of instrument is well-known for its high degree of accuracy and excellent performance. It can be used to measure various parameters such as surface topography, electrical properties, materials properties, and many other physical properties.

The main application field of the 2LP27 is in the field of nanotechnology. It is used to measure and analyze nanoscale structures and materials. Examples of applications can be found in research and production of ultra-thin films and sputtered thin films, the fabrication of semiconductor devices, 3D nanostructures, and in the characterization of device materials. The instrument is also used in the fields of semiconductor characterization and device failure analysis.

The basic working principle of 2LP27 is based on the electron beam induced current (EBIC) effect. The EBIC effect is a kind of interaction of the electron beam with a sample that results in the generation of signals that are then measured. The current generated by this effect is dependent on the composition and arrangement of the sample\'s structure as well as the electron beam\'s energy. This effect enables the instrument to measure and analyze different physical properties such as composition, surface topography, electrical properties, and other parameters.

The instrument also utilizes electrons to generate images of the sample, which are used to further calculate various parameters such as surface topography. Additionally, the instrument is also capable of measuring the electrical properties of the sample by changing the electron beam energy. This is beneficial in the study of semiconductor devices and other materials, as it helps to identify defects.

Overall, the 2LP27 is a powerful instrument used for nanoscale measurements and analysis. It is primarily used for research and production of ultra-thin films and sputtered thin films, the fabrication of semiconductor devices, and other nanoscale applications. The instrument utilizes electrons to generate images and measure various electrical and physical characteristics, such as surface topography, electrical properties, and materials properties.

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