3E1.6UM

The 3E1.6UM microscopy is an advanced electron microscope technique which can be used to measure, analyze and image samples in a wide variety of fields. It is a powerful tool for researchers studying the structure and composition of materials and objects on the nanometer scale. In this article, we will discuss the application fields and working principles of 3E1.6UM microscopy.

Applications

3E1.6UM microscopy is used in a variety of fields such as materials research, nanotechnology, and life science. It is applied as a powerful and non-destructive tool to investigate the structure and composition of objects with unprecedented detail. For example, it can be used to measure the thickness of thin films and layers, analyze defects in materials, investigate the composition of polymers and biomedical samples, identify nano-particles, and map the electrical properties of samples.The most common application of 3E1.6UM microscopy is in the field of electronics inspection. In this field, the microscope is used to inspect the quality of manufactured components such as cell phone chips, transistors, and integrated circuits. It can be used to detect defects such as contamination and age degradation.

Working Principle

The 3E1.6UM microscopy uses a technique known as scanning transmission electron microscopy (STEM). In this technique, a focused beam of electrons is scanned across a sample in a raster pattern. The scattered electrons are detected by a secondary detection electron detector, which measures the intensity of the electrons at each point. This data is used to build a three-dimensional image of the sample. The STEM technique also allows the user to measure the composition of samples by using an energy-dispersive spectrometer (EDS). The EDS measures the energy of the electrons as they are scattered from the sample and is used to identify the composition of the sample.

Conclusion

The 3E1.6UM microscopy is an advanced electron microscope technique which can be used to measure, analyze, and image materials and objects on the nanometer scale. It is used in a variety of fields such as materials research, nanotechnology, and life sciences. It is based on the scanning transmission electron microscopy technique and uses an energy-dispersive spectrometer to measure the composition of samples.

3E1.6UM

Altech Corpo...

37.42 $

1000

3E1.6UM 1.6A CIRCUIT BREA...