3E15UM

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3E15UM, otherwise known as Electron Evaporation Thickness Controller, is a microcontroller based device that is used for precision thin film measurement and control (such as in the deposition or film processing portion of semi-conducting industry). The technology used in 3E15UM makes it one of the most reliable and accurate methods of controlling the film thickness.

Essentially, the 3E15UM is composed of a microcontroller, a control board and an 8-bit A/D converters, as well as an array of temperature sensors and two infrared sensors. The microcontroller contains the logic for the entire system, while the control board is responsible for controlling the various inputs and outputs of the 3E15UM device. Additionally, the 8-bit A/D converters make sure that the device can accurately measure the voltage and temperature of the thin films.

In terms of the application field and working principle of 3E15UM, it is typically used in thin film deposition and processing operations. The essential principle is based on the fact that thin film layers can be accurately measured and controlled using the 3E15UM device. The device can detect the thickness of the film layers in a variety of ways, such as by using infrared (IR) light or by measuring current, resistance or capacitance. The device then uses these measurements to accurately calculate the thickness of the film layers and consequently, control the flow rate of the film.

Using the 3E15UM device, it is possible to accurately control the thickness of thin film layers within 1nm. This level of accuracy is unmatched by any other measuring or controlling device on the market, making it the ideal choice for precision thin-film deposition and processing operations. Furthermore, the device can also be used to measure the layer thickness of many other materials, such as quartz, LCD or thin-film silicon, offering a wide range of uses.

Another unique feature of the 3E15UM is its ability to be programmed in different modes. These modes include automatic film thickness control (ATC), manual film thickness control (MTC) and constant film thickness control (CTC). This feature allows users to adjust and optimize the film deposition rate, depending on the specific thin film process. Additionally, the device also offers temperature compensation, which helps to keep the accuracy of the device during temperature variations.

In conclusion, 3E15UM is an advanced microcontroller based device that is designed to accurately measure and control thin film layers during deposition processes. It is capable of detecting the thickness of the thin film layers in a variety of different ways, such as via infrared light or by measuring resistance, capacitance or current. Additionally, the device also offers numerous other features, including three different control modes and temperature compensation. Therefore, 3E15UM can be used in a wide range of application fields, from semi-conductor industry to laboratories.

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