SI53159-EVB

Series:	--
Part Status:	Active
Type:	Timing
Function:	Clock Buffer
Embedded:	No
Utilized IC / Part:	SI53159
Primary Attributes:	PCI Express (PCIe) Gen1, Gen2 and Gen3 Compliant
Supplied Contents:	Board(s)
Secondary Attributes:	9 Ports

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The SI53159-EVB evaluation and demonstration board and kit is a versatile testing system designed to simplify SI53159 clocking solutions. The system is intended to help engineers quickly and easily evaluate, monitor, and adjust the low jitter performance of the SI53159 clock generator. The board and kit provide a comprehensive suite of tools for engineers looking to validate SI53159 performance while experimenting with various circuit configurations.The SI53159-EVB board includes a two-stage signal chain with an SI53159 clock generator at the input and a variable input clock, a single DAC for adjusting the signal and a clock display connected to the system for observation. The board also offers an onboard temperature sensor and a 12-bit PWM DAC that can be used for thermal compensation to ensure that the timing remains consistent with temperature variation.The SI53159-EVB board kit supplies an adjustable SMA-coaxial system for easy connection of the board and test equipment, including a clock generator, variable input clock, and monitor. The kit also provides connectors for the board\'s temperature sensor and DAC, along with the necessary power and data connections to enable testing of the board. To facilitate experiments using the SI53159-EVB board and kit, an open source software package is included to enable users to control the board and evaluate its performance. With the software, engineers can measure jitter and monitor the performance of the clock generator, factor in temperature variation to compare results, and adjust the signal throughout their testing. In addition, the SI53159-EVB board and kit offers a number of features that enable engineers to explore numerous circuit configurations with ease. The board includes two differential outputs which can be used to facilitate clock-tree testing. For additional control, there are options to adjust the onboard input clock jitter, period, and duty cycle as well as to limit the SI53159\'s output frequency range. With this combination of features, it is possible to investigate the SI53159\'s performance from various perspectives. Overall, the SI53159-EVB evaluation and demonstration board and kit provides engineers with an all-in-one solution for quickly and easily testing SI53159 clocking solutions. Its comprehensive suite of tools and features simplifies the evaluation process while providing an array of possibilities for further exploration of the board’s performance characteristics.

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