IS25LQ040B-JKLE-TR

Introduction to IS25LQ040B-JKLE-TR

IS25LQ040B-JKLE-TR is a 4-megabit, with divide and sector erase, Flash memory that provides high performance, high reliability features and multiple peripheral options. This Flash memory is suitable for use in consumer and high-volume commercial applications.

Application Field

IS25LQ040B-JKLE-TR is compatible with the Serial Peripheral Interface (SPI) protocol and is a versatile non-volatile memory that can be used for consumer, industrial and automotive applications. It also can be used for code storage and data transfer for consumer and commercial grade microcontrollers and microprocessors. Other possible applications are secure storage, data logging and record keeping, secure boot code, secure code storage, data streaming, and power-gone buffer storage.

Working Principle

IS25LQ040B-JKLE-TR is a single-voltage version of the 4-megabit IS25LQ040B flash memory. It is a non-volatile memory supported by a uniform 64 byte instruction set, and has a Serial Peripheral Interface (SPI) 3-wire bus interface. It supports 3-byte addressing, 2.7 - 3.6 V I/O voltage, and has 2048 bytes per page. The ISL25LQ040B operates at a frequency of up to 60MHz.

IS25LQ040B-JKLE-TR can do a single cycle program which makes it significantly faster than the previous memory chips in the same product family. The maximum write command latency for this device is 7 μs. The memory supports several erase modes, including divide and sector erase. It also has high reliability features, including built-in over-voltage and read disturb protection, and datastrobe detection.

The ISL25LQ040B also has several peripheral features, including an on-chip oscillator, high voltage detection and reset, embedded security and selectable write enable/disable functions. The on-chip oscillator simplifies user design and reduces the number of external components. The high voltage detection and reset circuit of the ISL25LQ040B protects the device against over-voltage on the power supplies, and increases overall system reliability.