Allicdata Part #: | EVAL-CN0377-EB1Z-ND |
Manufacturer Part#: |
EVAL-CN0377-EB1Z |
Price: | $ 194.26 |
Product Category: | RF/IF and RFID |
Manufacturer: | Analog Devices Inc. |
Short Description: | EVALUATION BOARD |
More Detail: | N/A |
DataSheet: | EVAL-CN0377-EB1Z Datasheet/PDF |
Quantity: | 3 |
1 +: | $ 176.59500 |
Series: | * |
Part Status: | Active |
Type: | Switch, SP4T |
Frequency: | 0Hz ~ 14GHz |
For Use With/Related Products: | ADGM1304 |
Supplied Contents: | Board(s) |
Due to market price fluctuations, if you need to purchase or consult the price. You can contact us or emial to us: sales@allicdata.com
The EVAL-CN0377-EB1Z is a high-performance, user-friendly, and cost-effective RF evaluaton and development platform specially designed for EMI emissions and immunity testing of systems containing RF power amplifiers. This platform houses a 14-bit, 8-channel data acquisition system embedded with its own signal generation and processing capabilities. It is powered by a 32-bit ARM Cortex-M4 core enabling signal sampling at up to 1.25MS/s and a 16-bit 1MS/s sigma-delta A/D converter. The kit also features a wide range of I/O, including 7 analog input channels, 2 analog output channels, and several digital I/O. The flexibility and scalability of the EVAL-CN0377-EB1Z makes it a perfect choice for a number of RF related applications, including EMC testing, RF signal characterization, and component testing.
The EVAL-CN0377-EB1Z is an excellent platform for users who need to evaluate the performance of RF power amplifiers under high frequency conditions. This platform provides the necessary data acquisition and signal generation capabilities to accurately test the EMI performance of RF power amplifiers. It allows for accurate measurements of transmitted messages, signal distortion and gain characteristics of the amplifier. The board also features a wide range of RF signal analysis capabilities, such as measuring harmonics and spurious emissions that help in identifying potential sources of interference.
In addition to emissions testing, the EVAL-CN0377-EB1Z can also be used for EMI susceptibility tests. It contains a built-in near-field probe that enables users to measure RF fields around and inside of components. This can be particularly useful for identifying potential sources of interference, for example, conducted or radiated EMI that could cause performance degradation in the system. The kit also offers several other measurement parameters, including power spectral density, return loss and evoked response measurements.
The EVAL-CN0377-EB1Z is a comprehensive RF test and development platform that offers an easy to use, cost-effective solution for EMI emissions and susceptability testing. It features a number of high-performance analog and digital signal processing and acquisition components, as well as a wide range of I/O for convenient connectivity. Additionally, this platform is powered by a 32-bit ARM Cortex-M4 core that enables fast data acquisition and signal generation, making it ideal for high-throughput EMI testing.
The specific data is subject to PDF, and the above content is for reference
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