MAZS360GML Discrete Semiconductor Products

Diodes - Zener - Single

MAZS360GML is an advanced single diode Zener device with low forward voltage drop and built-in optimized surge protection. It provides excellent ESD soft protection and features a good reverse voltage blocking capability. MAZS360GML is designed for use in a wide range of electrical and electronic circuits.

As a single diode Zener, MAZS360GML is manufactured from a silicon-based substrate and utilizes its Zener characteristic to produce a desired voltage drop. It has two terminals – the anode and the cathode – and when reverse-biased, it translates to a Zener voltage drop. When forward-biased, it then acts as a normal diode.

The advantages of using a diode-Zener combination are numerous, such as low leakage current, temperature-independent voltage stabilization, and reliable ESD protection. MAZS360GML also integrates an optimized surge protection feature to control inrush currents and minimize Leakage Current variation. The device supports surge ratings up to 400V.

Applications for MAZS360GML include embedded systems, industrial machines, automotive applications, power supplies, and medical equipment. It is intended for use in industrial and consumer products. MAZS360GML can be used to control the voltage drop between its two terminals, maintain constant current flow, and provide ESD protection in sensitive circuits.

The MAZS360GML is composed of a combination of a junctionless Zener diode and a well-matched Zener diode. The integrated device provides superior protection against EMI, surges and other forms of electrical interference while maintainig a low forward voltage drop and requiring low leakage current. It also includes a temperature compensation design, which helps to protect the device from high ambient temperatures and ensures operation at the desired voltage.

In order to ensure reliable long-term operation, MAZS360GML should be stored and operated in accordance with the device’s electrical, environmental, and mechanical specifications. For critical applications, proper testing of the device should be conducted prior to its incorporation into a circuit.