| Allicdata Part #: | MT29F32G08ABCDBJ4-6IT:D-ND |
| Manufacturer Part#: |
MT29F32G08ABCDBJ4-6IT:D |
| Price: | $ 0.00 |
| Product Category: | Integrated Circuits (ICs) |
| Manufacturer: | Micron Technology Inc. |
| Short Description: | IC FLASH 32G PARALLEL 166MHZ |
| More Detail: | FLASH - NAND Memory IC 32Gb (4G x 8) Parallel 166M... |
| DataSheet: | MT29F32G08ABCDBJ4-6IT:D Datasheet/PDF |
| Quantity: | 1000 |
| 1 +: | 0.00000 |
| Series: | -- |
| Part Status: | Active |
| Memory Type: | Non-Volatile |
| Memory Format: | FLASH |
| Technology: | FLASH - NAND |
| Memory Size: | 32Gb (4G x 8) |
| Clock Frequency: | 166MHz |
| Write Cycle Time - Word, Page: | -- |
| Memory Interface: | Parallel |
| Voltage - Supply: | 2.7 V ~ 3.6 V |
| Operating Temperature: | -40°C ~ 85°C (TA) |
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Memory devices are essential in modern electronic devices, as they are used to provide storage capacity and to access data or information upon request. The MT29F32G08ABCDBJ4-6IT:D is a type of memory device from Micron Technology Incorporated of Boise, Idaho. Its application field lies within the realm of data storage, and its working principle is based on a NAND memory type for storage.
NAND flash memory is a type of non-volatile memory; meaning that data stored on the memory will not be lost in the event of power loss. This is made possible through the use of individual memory cells that contain an array of transistors. Each of these transistors has two charge states, and depending on their respective charge states data can be stored on the memory. The MT29F32G08ABCDBJ4-6IT:D memory enables read/write operations through the utilization of these individual memory cells.
When reading data from the MT29F32G08ABCDBJ4-6IT:D memory device, a high current is typically applied to the control circuitry and cells in order to read data from the memory. Depending on the state of the cells, a logic ‘0’ or a logic ‘1’ will be outputted from the device. Thus, utilizing this method both binary and non-binary data can be read from the memory.
Write operations to the MT29F32G08ABCDBJ4-6IT:D memory device involve applying electric pulses to the respective cells of the memory. By applying a negative charge through the electric pulse, the cells are conditioned to store a logic ‘0’. Conversely, applying a positive charge to the electric pulse conditions the cells to store a logic ‘1’. This process can overwrite existing data or can be used to write new data onto the memory.
In addition to reading and write operations, the MT29F32G08ABCDBJ4-6IT:D utilizes special algorithms to ensure the integrity and quality of data stored on the memory. Its End-to-End data path protection system minimizes data corruption and other errors by verifying the accuracy of data written to the memory cells before data is outputted. Moreover, cyclic redundancies and soft ECC is used to identify errors in data writing, and if any discrepancies are found, errors are corrected.
The MT29F32G08ABCDBJ4-6IT:D is commonly used in devices such as USB storage devices, smart cards, and embedded systems, due to its combination of data integrity, data storage density and energy savings. It is also beneficial to be able to store and access data to and from a non-volatile memory so that the memory remains intact and can be used in multiple applications.
The MT29F32G08ABCDBJ4-6IT:D memory device is a multi-functional memory that has been designed to provide large amounts of non-volatile data storage. Its NAND based memory technology enables read/write operations, end-to-end data path protection, and algorithms for data integrity. All of these features combined make the MT29F32G08ABCDBJ4-6IT:D a reliable and versatile memory device that is capable of handling intense and demanding data storage requirements.
The specific data is subject to PDF, and the above content is for reference
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MT29F32G08ABCDBJ4-6IT:D Datasheet/PDF