BAR 63-05 E6433 Allicdata Electronics
Allicdata Part #:

BAR63-05E6433-ND

Manufacturer Part#:

BAR 63-05 E6433

Price: $ 0.00
Product Category:

Discrete Semiconductor Products

Manufacturer: Infineon Technologies
Short Description: DIODE RF CC 50V 100MA SOT-23
More Detail: RF Diode PIN - 1 Pair Common Cathode 50V 100mA 250...
DataSheet: BAR 63-05 E6433 datasheetBAR 63-05 E6433 Datasheet/PDF
Quantity: 1000
1 +: 0.00000
Stock 1000Can Ship Immediately
$ 0
Specifications
Series: --
Packaging: Tape & Reel (TR) 
Part Status: Obsolete
Diode Type: PIN - 1 Pair Common Cathode
Voltage - Peak Reverse (Max): 50V
Current - Max: 100mA
Capacitance @ Vr, F: 0.3pF @ 5V, 1MHz
Resistance @ If, F: 1 Ohm @ 10mA, 100MHz
Power Dissipation (Max): 250mW
Operating Temperature: 150°C (TJ)
Package / Case: TO-236-3, SC-59, SOT-23-3
Supplier Device Package: SOT-23-3
Base Part Number: BAR63-05
Description

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  • BAR 63-05 E6433

The BAR 63-05 E6433 is part of a wide range of materials science research tools, developed for use in cutting-edge research applications. Initially designed to study the characteristics of modern semiconductor materials such as gallium nitride and tantalum oxide, it has evolved to include other areas of research and is now also used in experiments related to nanotechnology and bio-inspired systems.

BAR 63-05 E6433 was developed by Bridgelux, a company specializing in the production of semiconductor materials, to provide an accurate and reliable approach to the testing and characterization of these materials and related components. Bridgelux has a long history of producing high-performance materials, and their expertise makes the BAR 63-05 E6433 a reliable and well-documented tool.

Application Field

The most common application for the BAR 63-05 E6433 is the study and evaluation of semiconductor materials. This includes testing the physical and electrical properties of gallium nitride (GaN) and other related materials, as well as testing and characterizing components such as lasers, LEDs, and other optoelectronic devices. The device has also been used in the study of materials for bio-inspired systems, particularly in the development of nanomaterials for solar cells and optical interconnects.

In addition, the BAR 63-05 E6433 is also used for the measurement and evaluation of the nanostructural properties of a variety of materials, including ferroelectrics, photovoltaics, and nanomagnets. These materials are often used in the development of advanced technologies, such as quantum computing or optoelectronics, and so their analysis is critical to understanding their properties.

Working Principle

The working principle of the BAR 63-05 E6433 is based on the use of high-energy photons to excite material defect sites, and then measure the energy released. This energy is then used to characterize the material and its components, enabling researchers to assess its properties in a highly accurate and detailed manner.

The BAR 63-05 E6433 is designed to produce extremely high-resolution images of material samples, providing researchers with the information they need to understand the atomic-level properties of a material. By enabling detailed analysis of the material structure, the device can give researchers extremely accurate information about a material’s properties, allowing them to make better decisions and optimize their research.

In short, the BAR 63-05 E6433 is a valuable tool for researchers in the field of materials science and nanotechnology, offering an accurate and reliable approach to the testing and characterization of advanced materials and related devices. With its versatile range of application areas, the device is suitable for use in a variety of research and development projects, from the study of semiconductor materials to the development of new solar cells.

The specific data is subject to PDF, and the above content is for reference

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