UP0431N00L Allicdata Electronics

UP0431N00L Discrete Semiconductor Products

Allicdata Part #:

UP0431N00LTR-ND

Manufacturer Part#:

UP0431N00L

Price: $ 0.00
Product Category:

Discrete Semiconductor Products

Manufacturer: Panasonic Electronic Components
Short Description: TRANS PREBIAS NPN/PNP SSMINI6
More Detail: Pre-Biased Bipolar Transistor (BJT) 1 NPN, 1 PNP -...
DataSheet: UP0431N00L datasheetUP0431N00L Datasheet/PDF
Quantity: 1000
1 +: 0.00000
Stock 1000Can Ship Immediately
$ 0
Specifications
Series: --
Packaging: Tape & Reel (TR) 
Part Status: Obsolete
Transistor Type: 1 NPN, 1 PNP - Pre-Biased (Dual)
Current - Collector (Ic) (Max): 100mA
Voltage - Collector Emitter Breakdown (Max): 50V
Resistor - Base (R1): 4.7 kOhms
Resistor - Emitter Base (R2): 47 kOhms
DC Current Gain (hFE) (Min) @ Ic, Vce: 80 @ 5mA, 10V
Vce Saturation (Max) @ Ib, Ic: 300mV @ 300µA, 10mA
Current - Collector Cutoff (Max): 500nA
Frequency - Transition: 150MHz, 80MHz
Power - Max: 125mW
Mounting Type: Surface Mount
Package / Case: SOT-563, SOT-666
Supplier Device Package: SSMINI6-F1
Description

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The UP0431N00L is a type of composite array that utilizes bipolar junction transistors (BJT) designed specifically to provide pre-biased voltage outputs. It is used in various applications to provide equal linearity of multiple channels or to increase overall channel speed of an electronic system. In some applications, the UP0431N00L is used to reduce system complexity, decrease power consumption, and improve field testing capability.

In terms of basic functionality, the UP0431N00L is a pre-biased composite array. It takes a single input voltage and divides it into two separate outputs, each of which is at a different voltage than the input. The advantage of this type of design is that it allows for more precise control over the logic operations of each output. Additionally, this type of pre-biased array offers a simpler alternative than traditional BJT circuits for complex applications.

The UP0431N00L owes its pre-biased functionality to its unique architecture. It consists of two BJTs connected in a specific way so that when the input voltage is applied, the output is automatically divided into two separate outputs with different voltages. The UP0431N00L works by taking the input voltage and generating an internal output voltage (called the pre-bias voltage). The pre-bias voltage is then coupled with the input voltage to generate the two separate outputs with different voltages.

In terms of performance, the UP0431N00L offers a significant improvement over traditional designs. It operates at lower temperatures and with higher switching speeds. Additionally, it provides improved accuracy and better power efficiency. As a result, the UP0431N00L is typically used in applications that require high-performance, high-precision, and low-power BJT arrays.

The UP0431N00L is primarily used in high-speed signal processing and data acquisition systems, where it is implemented to provide enhanced signal conditioning and higher resolution. It is also used in telecommunications systems for signal modulation and for signal amplification. Additionally, it is used in digital signal processing (DSP) applications, where it is used to provide a pre-bias circuit for improved signal processing and parameter extraction.

Additionally, the UP0431N00L is used in radio frequency (RF) circuits, where it is used to filter, modulate, and amplify broadband signals. Additionally, it is used in audio and video applications, where it is employed to provide low-noise mixer and amplifier designs. Finally, the UP0431N00L is used in biomedical platforms for fiber imaging and for signal processing.

To summarize, the UP0431N00L is a pre-biased bipolar junction transistors (BJT) composite array that provides improved linearity and switching speeds over traditional BJT implementations. It is used in a variety of applications, from high-speed signal processing to radio frequency circuits, to provide enhanced performance and improved accuracy. Additionally, the UP0431N00L can be used to reduce system complexity, decrease power consumption, and improve field testing capability.

The specific data is subject to PDF, and the above content is for reference

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