Allicdata Part #: | IPB031N08N5ATMA1TR-ND |
Manufacturer Part#: |
IPB031N08N5ATMA1 |
Price: | $ 1.17 |
Product Category: | Discrete Semiconductor Products |
Manufacturer: | Infineon Technologies |
Short Description: | MOSFET N-CH 80V TO263-3 |
More Detail: | N-Channel 80V 120A (Tc) 167W (Tc) Surface Mount D²... |
DataSheet: | IPB031N08N5ATMA1 Datasheet/PDF |
Quantity: | 6000 |
1000 +: | $ 1.06603 |
Vgs(th) (Max) @ Id: | 3.8V @ 108µA |
Package / Case: | TO-263-3, D²Pak (2 Leads + Tab), TO-263AB |
Supplier Device Package: | D²PAK (TO-263AB) |
Mounting Type: | Surface Mount |
Operating Temperature: | -55°C ~ 175°C (TJ) |
Power Dissipation (Max): | 167W (Tc) |
FET Feature: | -- |
Input Capacitance (Ciss) (Max) @ Vds: | 6240pF @ 40V |
Vgs (Max): | ±20V |
Gate Charge (Qg) (Max) @ Vgs: | 87nC @ 10V |
Series: | OptiMOS™ |
Rds On (Max) @ Id, Vgs: | 3.1 mOhm @ 100A, 10V |
Drive Voltage (Max Rds On, Min Rds On): | 6V, 10V |
Current - Continuous Drain (Id) @ 25°C: | 120A (Tc) |
Drain to Source Voltage (Vdss): | 80V |
Technology: | MOSFET (Metal Oxide) |
FET Type: | N-Channel |
Part Status: | Active |
Packaging: | Tape & Reel (TR) |
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The IPB031N08N5ATMA1 is a type of N-channel Enhancement Mode Field Effect Transistor (FET) designed for low voltage and high speed applications. It is a type of single enhancement-mode MOSFET, which has a N-type semiconductor channel and the current flows through the channel when a gate voltage is applied. The IPB031N08N5ATMA1 FET is an ideal choice for low voltage switching applications, such as low voltage gate drive, motor controllers, and other low voltage switching applications.
Construction
The IPB031N08N5ATMA1 FET is constructed using a single layer of N-type silicon material on a substrate. The silicon material is surrounded by a gate oxide layer on the surface and a source/drain region connected to the silicon layer. A metal gate is placed on top of the gate oxide layer, and a source/drain diffusion layer is connected to the source/drain region. A protective layer is placed on top of the structure to provide electrical isolation from the environment.
Operation and Working Principle
The IPB031N08N5ATMA1 FET operates on the principal of the MOSFET. This device works by applying an electric field through a gate oxide layer to modify the properties of the N-type silicon. When a negative voltage is applied to the gate, the negative charge induced into the N-type layer creates an inversion layer at the surface of the silicon material. This inversion layer changes the conductivity of the material, and causes the current to flow through the channel.
The IPB031N08N5ATMA1 is a voltage-controlled device, meaning that the gate voltage (Vgs) controls the flow of current through the device. When the gate voltage is negative, the device is “OFF” and no current will flow through the device. Conversely, when the gate voltage is positive, the device will turn “ON” and the current through the FET will be controlled by the gate voltage.
Applications
The IPB031N08N5ATMA1 FET is suitable for a variety of low voltage and high speed applications. It is commonly used for low voltage gate drive applications, such as lighting control and motor controllers. It is also used in power switches and other low voltage switching applications. This device is ideally suited for use in low voltage, high speed applications due to its low RDS (ON) and low gate capacity.
Advantages
The biggest advantage of the IPB031N08N5ATMA1 is that it is a low power, high speed device. It has a very low RDS (ON) which allows for better efficiency in low voltage applications. It also has a low gate capacitance, which results in higher switching speeds. Furthermore, the device has excellent immunity to corrosion, making it a great choice for high humidity environments.
Disadvantages
One of the drawbacks of the IPB031N08N5ATMA1 is that it has a limited current capacity of only 1.8A. This is relatively low compared to other transistors, and can be an issue when using the device in high current applications. Furthermore, the device is relatively sensitive to thermal stress, and can be damaged in extreme temperatures.
The specific data is subject to PDF, and the above content is for reference
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