IPD50R2K0CEAUMA1 Allicdata Electronics
Allicdata Part #:

IPD50R2K0CEAUMA1-ND

Manufacturer Part#:

IPD50R2K0CEAUMA1

Price: $ 0.13
Product Category:

Discrete Semiconductor Products

Manufacturer: Infineon Technologies
Short Description: MOSFET N-CH 500V 2.4A PG-TO252
More Detail: N-Channel 500V 2.4A (Tc) 33W (Tc) Surface Mount PG...
DataSheet: IPD50R2K0CEAUMA1 datasheetIPD50R2K0CEAUMA1 Datasheet/PDF
Quantity: 1000
2500 +: $ 0.11028
Stock 1000Can Ship Immediately
$ 0.13
Specifications
Vgs(th) (Max) @ Id: 3.5V @ 50µA
Package / Case: TO-252-3, DPak (2 Leads + Tab), SC-63
Supplier Device Package: PG-TO252-3
Mounting Type: Surface Mount
Operating Temperature: -55°C ~ 150°C (TJ)
Power Dissipation (Max): 33W (Tc)
FET Feature: --
Input Capacitance (Ciss) (Max) @ Vds: 124pF @ 100V
Vgs (Max): ±20V
Gate Charge (Qg) (Max) @ Vgs: 6nC @ 10V
Series: CoolMOS™ CE
Rds On (Max) @ Id, Vgs: 2 Ohm @ 600mA, 13V
Drive Voltage (Max Rds On, Min Rds On): 13V
Current - Continuous Drain (Id) @ 25°C: 2.4A (Tc)
Drain to Source Voltage (Vdss): 500V
Technology: MOSFET (Metal Oxide)
FET Type: N-Channel
Part Status: Active
Packaging: Tape & Reel (TR) 
Description

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IPD50R2K0CEAUMA1 is a type of Transistor - FETs, MOSFETs - Single, which can be used in thin film deposition and thin-film systems. It is mainly composed of a semiconductor material and a surface passivation layer. The semiconductor material can be a wide-bandgap material such as gallium nitride (GaN) or silicon carbide (SiC). The surface passivation layer is used to increase the electrical performance of the device. The device also has a small parameter N-style metal-oxide-semiconductor (MOS) field-effect transistor (FET) with a low on-state resistance.

The IPD50R2K0CEAUMA1 has a low on-state resistance and can handle high current densities. It is also very thermally efficient and can withstand high temperatures. This makes it an excellent choice for applications in which high-power performance is required. For example, it can be used in power electronics for switching applications, in radio frequency (RF) applications for amplifying signals, and in high-efficiency lighting for power conversion.

The working principle of the IPD50R2K0CEAUMA1 is quite simple. It consists of a substrate material, an N-type MOSFET, and a gate electrode. The substrate material is a wide-bandgap semiconductor material, such as GaN or SiC. The N-type MOSFET is placed on the substrate, and a gate electrode is placed on top of the MOSFET. The operation of the device depends on the interaction between the gate voltage and the substrate material.

When the gate voltage of the device is high, a channel is formed between the source and drain contacts, allowing electrons to travel through the channel. This leads to an increase in current flow through the device. When the gate voltage is decreased, the channel is closed, and the current flow through the device is reduced. By varying the gate voltage, the current flow through the device can be controlled.

In addition, the IPD50R2K0CEAUMA1 can be used in thin film deposition and thin-film systems. In these systems, the device is typically placed between a substrate material, such as glass or ceramic and a metal layer. By applying a voltage between the substrate material and the metal layer, the MOSFET can be used to control the growth of thin-film materials. This is often used for the deposition of protective coatings or for semiconductor structures.

Overall, the IPD50R2K0CEAUMA1 is an excellent choice for applications in which high-power performance is required. It is widely used in power electronics, RF, and high-efficiency lighting applications. The device is also used in thin film deposition and thin-film systems, and its high-power performance is invaluable in these applications. Its ability to regulate current flow based on gate voltage also serves to make it a very versatile device.

The specific data is subject to PDF, and the above content is for reference

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